Support for high-purity gas purification technology and trace gas impurity measurement technology!
Our company supports high-purity gas purification technology and trace gas impurity measurement technology using 'API-MS' in the fields of semiconductor manufacturing, organic EL manufacturing, and advanced research. As for our track record in piping construction, we have gas supply equipment for the next-generation detector XMASS of Kamiokande and a gas sampling system for JAXA's Hayabusa II return chamber. Additionally, the 'API-MS' method has been registered with ISO as a high-sensitivity gas permeability evaluation device for films. *For more details, please download the PDF or contact us.
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【Related Products】 ■Film Gas Permeability Evaluation Device 'API-BARRIER' *For more details, please download the PDF or contact us.*
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Our company wishes for the further development of the Atmospheric Pressure Ionization Mass Spectrometry (APIMS) and provides services related to high-sensitivity gas analysis technologies centered around APIMS. We handle high-sensitivity gas analysis equipment such as the "FLEX-MS400," film permeability evaluation devices (registered as an inspection method under ISO), and temperature-programmed desorption gas measurement devices. It is used for monitoring high-purity nitrogen gas in the curation facilities for opening the capsules of Kamiokande's XMASS and JAXA's Hayabusa2 (planetary material sample acceptance facilities).
![[Analysis Case] Structural Analysis of Fluoropolymer by LDI-MS](https://image.mono.ipros.com/public/product/image/458/2001216941/IPROS21418647727252247343.jpeg?w=280&h=280)
![[Analysis Case] Qualitative and Imaging Analysis of Micro Areas Using TOF-SIMS](https://image.mono.ipros.com/public/product/image/dbd/2000287063/IPROS7457515137597281490.jpg?w=280&h=280)
