A broadband spectral reflection measurement system that combines two spectrometers with different wavelength ranges!
The "OP-SpecWide-RF" is an affordable broadband spectral reflectance measurement system that covers a wide measurement range from the visible to near-infrared regions (400 to 1650 nm). It utilizes the FLAME-S spectrometer equipped with a silicon CCD detector for measurements in the visible range, and the FLAME-NIR equipped with an InGaAs detector for measurements in the near-infrared range. The included standard software for spectral measurement, OPwave+, allows for the display and data storage of the two spectra. By combining two different spectrometers, it can be used as a measurement system similar to a broadband spectrophotometer. With the selection of sample holders and optical stages, it can accommodate reflectance measurements of various materials such as semiconductors, coatings, and food that have a broad reflectance distribution. 【Features】 ■ Covers a wide measurement range ■ Affordable model ■ Supports measurements in the visible and near-infrared regions ■ Measurement system similar to a broadband spectrophotometer ■ Capable of reflectance measurements for various materials *For more details, please refer to the PDF document or feel free to contact us.
Inquire About This Product
basic information
【System Configuration Example】 ■FLAME-S Fiber Multi-Channel Spectrometer Grating #3: 350–1000nm / Entrance Slit Width 5μm ■FLAME-NIR Near Infrared Fiber Multi-Channel Spectrometer Grating #NIR3: 950–1650nm / Entrance Slit Width 25μm ■HL-2000-LL Halogen Light Source ■R200-12-MIXED 3-Way Broad-Band Reflection Probe ■OPwave+ Standard Software for Spectral Measurement *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Applications】 ■ Spectral analysis through reflection measurement of food and agricultural products ■ Reflection measurement of optical components such as lenses and filters ■ Reflection measurement of semiconductors, solar cell substrates, and glass materials ■ Measurement of interference spectra of thin films and coatings *For more details, please refer to the PDF document or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
We offer a wide range of cutting-edge products from manufacturers around the world, centered on light measurement devices, and we respond to our customers' needs with a powerful lineup. We provide detailed counseling and prepare products tailored to each customer's environment. Furthermore, we go beyond merely introducing products; we create high satisfaction for our customers by proposing system configurations that match their situations and objectives. "When you want to do ●●" or "When ●● is having trouble with △△." In such cases, please feel free to consult us. At Ocean Photonics, we leverage the knowledge and experience we have cultivated over many years to fulfill our customers' aspirations.