A wide variety of gratings are available. Suitable for calibration and test measurements.
This is a calibration grating for atomic force microscopes and scanning probe microscopes. Depending on the type of calibration and evaluation, you can select the appropriate grating. It can be used not only for calibration work of the equipment but also for test measurements in student experiments. - Z-axis calibration - One-axis calibration of the X or Y axis - Horizontal or vertical calibration of the scanner - Detection of nonlinearity - Detection of hysteresis - Detection of creep - Detection of angular deformation - Detection of cross-coupling effects - Evaluation of the shape and sharpness of AFM/SPM probe tips - Prevention of tip degradation and contamination
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basic information
This is a calibration grating for atomic force microscopes and scanning probe microscopes. It includes nine types of gratings, allowing you to select the appropriate grating based on the type of calibration and evaluation. In addition to calibration work for the equipment, it can also be used for test measurements in student experiments.
Price range
Delivery Time
※The delivery date may vary depending on the model and quantity, so please feel free to contact us.
Applications/Examples of results
- Calibration work for AFM/SPM - Test measurements for student experiments, etc.
Detailed information
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・Grating: TGZ1, TGZ2, TGZ3, TGZ4
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- Grating: TGQ1
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・Grating: TGT1
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・Grating: TGG1
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Grating: TGX1
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・Grating: TDG01
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・Grating Set: TGS1 ・Breakdown: TGZ1, TGZ2, TGZ3
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・Grating Set: TGS2 ・Breakdown: TGZ1, TGZ2, TGZ3, TGT1, TGG1, TGX1
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- Grating Set: TGSFull - Breakdown: TGZ1, TGZ2, TGZ3, TGT1, TGG1, TGX1, TGQ1, TDG01
Line up（9）
| Model number | overview |
|---|---|
| TGZ1 | Z-axis calibration grating ・Height 20nm (typical) |
| TGZ2 | Z-axis calibration grating ・Height 110nm (typical) |
| TGZ3 | Z-axis calibration grating ・Height 520nm (typical) |
| TGZ4 | Z-axis calibration grating ・Height 1517nm (typical) |
| TGQ1 | XYZ-axis simultaneous calibration grating ・3-axis simultaneous calibration ・Horizontal calibration of the scanner ・Detection of horizontal nonlinearity, hysteresis, creep, and cross-coupling effects |
| TGT1 | Pyramid-shaped calibration grating ・Evaluation of the shape and sharpness of AFM/SPM probe tips ・Prevention of tip degradation and contamination |
| TGG1 | Ridge-shaped calibration grating ・Calibration of the X-axis or Y-axis ・Detection of horizontal or vertical scanner nonlinearity ・Detection of angular deformation ・Tip characteristic evaluation |
| TGX1 | Calibration grating with a shape resembling a truncated trapezoid ・Calibration of the horizontal scanner ・Determination of horizontal nonlinearity, hysteresis, creep, and cross-coupling effects ・Determination of tip sharpness |
| TDG01 | Grating for submicron level calibration ・Calibration of the X-axis or Y-axis (278nm period) |
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Company information
MSH Systems Co., Ltd. introduces and provides cutting-edge scientific technologies and their products from both domestic and international sources to universities, research institutions, and corporate clients in Japan as quickly as possible, contributing to the realization of a richer future society. With 30 years of sales and service experience in the science and technology fields, along with strong trust relationships and responsible execution with our clients, we will act with all our efforts to become a good partner for everyone. Our ultimate goal is to ensure the satisfaction of not only our customers and manufacturers but also everyone involved with us.