Diverse mapping analysis is possible with user-friendly software!
The "EddyCus(R) TF map 2525 SR" is a non-contact sheet resistance mapping device capable of accurate mapping measurements of sheet resistance for low and high conductivity thin films. It features versatile mapping analysis through user-friendly software. It is suitable for mapping measurements of metal film layers, as well as monitoring the thickness of thin films and substrates. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Mapping measurement of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Other Features】 ■ Monitoring of thin film and substrate thickness (μm) ■ Sheet resistance mapping measurement of encapsulated layers ■ Various mapping analyses using user-friendly software *For more details, please refer to the PDF document or feel free to contact us.
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【Applications】 ■Architectural glass (LowE) ■Touch screens & flat monitors ■Materials for OLED & LED ■Materials for smart glass ■Transparent antistatic conductive plates ■Photovoltaic cells ■Semiconductors ■Materials for anti-freezing & heating ■Batteries & fuel cells ■Packaging materials *For more details, please refer to the PDF document or feel free to contact us.
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We are a trading company that delivers the latest overseas technologies and products. We handle vacuum components, moisture analyzers, substrate inspection equipment, and more.