Manual mapping measurements of sheet resistance are possible using user-friendly software.
The "EddyCus(R)TF lab 2020 series" is a non-contact sheet resistance measurement device. It accurately measures the sheet resistance of conductive films at a single point. Additionally, it can measure the thickness of metal film layers and monitor the thickness of thin films and substrates. Upon request, we evaluate the characteristics of multi-layer systems. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Accurate single-point measurement of sheet resistance of conductive films (Ohm/sq) ■ Thickness measurement of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.
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【Other Features】 ■ Monitoring of thin film and substrate thickness (μm) ■ Manual mapping measurement of sheet resistance ■ Evaluation of characteristics of multilayer systems upon request *For more details, please refer to the PDF document or feel free to contact us.
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【Applications】 ■ Architectural glass (LowE) ■ Touch screens & flat monitors ■ Materials for OLED & LED ■ Materials for smart glass ■ Transparent antistatic conductive plates ■ Photovoltaic cells ■ Semiconductors ■ Anti-freezing & heating materials ■ Batteries & fuel cells ■ Packaging materials *For more details, please refer to the PDF document or feel free to contact us.
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We are a trading company that delivers the latest overseas technologies and products. We handle vacuum components, moisture analyzers, substrate inspection equipment, and more.