Crystal defect detection device, Raman measurement device, strain silicon measurement device.
Equipped with a high-performance micro-sample chamber, enabling high-precision Raman spectroscopy measurements.
We have a variety of Raman measurement devices available to meet your needs.
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basic information
A Raman measurement device is a system that measures light scattered from a substance when it is illuminated with light, detecting wavelengths of light different from the incident light (Raman scattering). Based on this spectral information, it enables high-precision measurements of the degree of crystallization, distortion of the crystal lattice, and stress measurement of silicon substrates by standardly equipping a micro-sample chamber. It is equipped with a high-performance micro-sample chamber to achieve high-precision measurements. Various models are available according to the measurement targets, including wavenumber resolution, spatial resolution, short-wavelength excitation Raman, long-wavelength excitation Raman, low-wavenumber Raman, and stress in distorted silicon.
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Applications/Examples of results
Degree of crystallization and distortion of the crystal lattice Stress measurement of silicon substrates
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We are waiting for your inquiries and consultations regarding our products and services, such as the following: ■ Particle Size Distribution and Powder Measurement - I want to replace my particle size analyzer, but it's too expensive to implement. - I want to introduce an easy-to-operate particle size analyzer. - I want to measure particle size distribution in the nano range at a low cost. ■ Fluid Measurement and Visualization - Concerns about the visualization and quantification of fluids. - I introduced PIV software, but I can't measure effectively. - I want to simultaneously measure the flow velocity and particle size of spray particles. ■ Strain and Displacement Measurement - I want to measure strain in areas where strain gauges cannot be attached. - I want to analyze strain and displacement non-contactly. - I want to measure the distribution of strain over a surface. ■ Thin Film and Porous Material Evaluation - I would like to consult about mercury porosimeters that will no longer be usable due to the Minamata Convention. - I want to evaluate the gas diffusion performance of GDL and MEA in fuel cells. - I want to measure the permeability of barrier films at high speed. We welcome any inquiries, no matter how trivial, so please feel free to consult with us. We also have a lab room available for demonstrations and product tours.