For the reduction of man-hours and efficiency improvement of all EMC tests (immunity tests)!
- By establishing criteria for changing to a different semiconductor (IC), we can omit the re-execution of EMC tests associated with semiconductor changes, thereby achieving a reduction in man-hours. - By conducting DPI tests in the front-loading phase of product development, we can select semiconductors with high EMC resistance and anticipate a reduction in man-hours for EMC countermeasures. The DPI immunity testing method is an immunity evaluation method standardized for semiconductors (IC) by IEC standards. This test involves directly injecting RF interference power into the IC power supply on a test board equipped with the IC being evaluated, assessing the immunity resistance. The test requires gradually increasing the test level (power) for each test frequency and confirming the performance of the IC at each stage. Additionally, it is necessary to record the state of any malfunctions that occur, which is very labor-intensive and time-consuming. The DPI immunity testing system from the Noise Research Institute consistently performs everything from test execution to malfunction determination, making it a groundbreaking automation system that reduces testing time and the effort required from testers.
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basic information
● Tests can be conducted in accordance with IEC 62132-4 (DPI method). ● Judgments compliant with the IC performance criteria of IEC 62132-1 (Class A/C/D1/D2/E) can be made automatically. ● Up to 10 judgment conditions (8 automatic measurement judgments + mask test judgment + serial decode judgment) can be freely combined to determine IC malfunctions. ● Multiple DC power supplies can be controlled to turn the power ON/OFF for IC resets in the event of a malfunction. ● Voltage values and reset times can be set according to the EUT (IC). ● The multi-sweep function can significantly reduce testing time. ● Tests can also be conducted using the TEM-Cell method (IEC 62132-2) and the IC stripline method (IEC 62132-8).
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Applications/Examples of results
- Establish criteria for switching to another semiconductor (IC) to reduce testing man-hours during PCN (Product Change Notification). - Evaluate semiconductors (IC) that could be a major cause of malfunction before testing the finished product, reducing man-hours for EMC measures through front-loading.
Detailed information
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**Regarding the Evaluation of Semiconductor EMC Performance Equivalence** The evaluation of semiconductor EMC performance equivalence is conducted for products that have the same functionality, with no changes in terminal configuration or terminal position, and no differences in electrical characteristics. The evaluation methods were established by the Electronic Information Technology Industry Association with JEITA ED-5008 (Semiconductor EMC Performance Equivalence Evaluation Method) in July 2020, and by the Society of Automotive Engineers with JASO D 019 (Automotive Semiconductor EMC Performance Equivalence Testing Method) in March 2021. There are two types of evaluations: conducted immunity performance equivalence evaluation and conducted emission performance equivalence evaluation. The conducted immunity performance equivalence evaluation is performed using the DPI method, and if the equivalence of the semiconductor product (IC) being modified can be proven, the product performance can be considered equivalent. Currently, some industries and sectors have begun conducting semiconductor EMC performance equivalence evaluations, and efforts to reduce the labor involved in EMC testing have started.
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Incorporating DPI immunity testing into the product development process Products are created through a process of planning → development design → circuit board design → implementation → assembly. After completion, EMC testing is conducted, and upon passing, the process moves to mass production. However, if the EMC test fails, noise countermeasures must be implemented, and the process returns to the design phase, resulting in additional labor. By incorporating DPI immunity testing as front-loading in the product development process, it becomes possible to quantitatively evaluate semiconductor products (ICs) that could be a major cause of malfunction, which is expected to reduce the labor required for EMC countermeasures.
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Company information
Our company was founded in 1975 as "a company that manufactures noise testing equipment to reproduce the malfunction of electronic devices" at a time when the term "EMC" began to be used as the phenomenon of malfunctions associated with the spread of computers was becoming a social issue. Since then, we have provided products that reproduce (output/measure) electrical noise phenomena such as electrostatic discharge, high current phenomena during lightning strikes, transient phenomena in automobiles, and visualization of electromagnetic fields, as well as contracted EMC testing services (contract testing site "Test Lab Funabashi") and technical materials such as "NoiseKen News" (formerly Technical Reports) and "Testing Method Guidebooks," leading to the adoption of our brand "NoiseKen" by over 5,000 customers in dozens of countries worldwide. Based on our history and achievements, we will continue to challenge the reproduction of electrical noise, which is the foundation of our establishment, while also responding to changes in the nature of testing and measuring instruments, including automation and simulation, aiming to be "a company that makes EMC testing easy for our customers." In doing so, we intend to contribute to EMC and noise countermeasures and create a "NoiseKen" that is recognized as a lasting presence by everyone.