Introducing fine pitch probes for wafer inspection compatible with a 0.15mm pitch!
The "RI-010HA-05-PDH" is a fine pitch probe for wafer inspection. It is compatible with a 0.15mm pitch and is suitable for vertical inspection. Multiple options are available for the plunger material as well. In addition, we offer a wide range of special probes for high-frequency applications, high-temperature applications, and Kelvin applications. 【Materials】 ■A Plunger: Pd Alloy ■Barrel: Ni / Inner Au ■Spring: SWP / Au-Plated ■B Plunger: SK / Au-Plated *For more details, please refer to the PDF document or feel free to contact us.
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【Design Specifications】 ■Pitch: 0.15 mm [.0059 in] ■Spring Force: 3.5 g (@0.3mm st) [0.12 oz (@.0118 in st)] ■Recommended Travel: 0.3 mm [.0118 in] 【Electrical Characteristics】 ■CRes: < 220 mΩ ■Current Rating: 0.6 A Continuous ■Insertion Loss: -0.3dB @10GHz ■Inductance: 1.17 nH *For more details, please refer to the PDF document or feel free to contact us.
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【Purpose】 ■Wafer Inspection *For more details, please refer to the PDF document or feel free to contact us.
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