The fine structure of the sample can be observed at the nanoscale using a transmission electron microscope (TEM)!
Our company is capable of producing high-precision thin film samples for TEM observation and achieving clear sub-nanometer order structural observations through advanced TEM observation techniques.
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basic information
TEM Observation - We conduct observations of nano-order structures and lattice images. - We perform analysis and evaluation using TEM images, as well as localized elemental analysis using EDX. Analysis and Evaluation Using TEM Images - We analyze crystal defects and perform strain mapping evaluation using high-resolution TEM images.
Price information
Please feel free to contact us regarding contract analysis.
Delivery Time
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Applications/Examples of results
Physical analysis of semiconductors and various other samples is widely utilized by domestic companies and universities.
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Company information
The Ion Tech Center is a professional group that provides consulting and technical development support in "ion implantation," "physical analysis," and research and development. We aim to be a good partner for companies and university researchers as a creative laboratory equipped with cutting-edge technology and facilities that meet the demands of the times.
![[Analysis Case] Structural Analysis of DRAM Chips using TEM and SEM](https://image.mono.ipros.com/public/product/image/4af/2000442428/IPROS10654005163802715970.jpg?w=280&h=280)
![[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation](https://image.mono.ipros.com/public/product/image/1ac/2000436264/IPROS14066786507828876230.jpg?w=280&h=280)
![[Analysis Case] Structural Evaluation of Magnetic Head MTJ Section](https://image.mono.ipros.com/public/product/image/94a/2000246127/IPROS2724621665965877801.jpg?w=280&h=280)
