Non-destructive sensing of internal degradation. Rapid detection of abnormalities in structures and machinery.
AE sensors are devices that capture elastic waves generated internally when materials deform or break and convert them into electrical signals. They can visualize the deterioration and fatigue occurring within structures, making them widely applicable for material evaluation of metals and composite materials, as well as for assessing the integrity of metal structures, FRP structures, and concrete structures. Since the elastic waves targeted by AE sensors are in the high-frequency range, they are not affected by environmental noise. Utilizing this property, it is possible to incorporate AI and IoT into the prediction and diagnosis of failures in factories, equipment, and infrastructure using AE sensors, contributing to the realization of advanced automated smart factories.
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basic information
[Specifications] - Channels: Up to 4CH - Resonant Frequency: 50kHz - Sampling: 1MHz - Operating Environment (OS): Windows 7/10 [Functions] - UI, Parameter Settings - Save and Load Configuration Information - Data Recording - Display Extracted Information - AE Waveform Extraction - Manual Abnormal Diagnosis
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Applications/Examples of results
Defect inspection, crack evaluation, equipment diagnosis, wear defect detection, safety monitoring, bearing anomaly diagnosis, cavitation detection.
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Company information
Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.