Significantly reduced non-point aberrations to the limit, greatly improving the resolution degradation that occurred at both ends of the wavelength!
The "MK-300" is a polychromator that excels in spatial resolution across the entire CCD detection surface, thanks to its newly designed aberration-correcting optical system. By attaching a CCD detector (sold separately), it is suitable for multi-point simultaneous spectral measurements using branched bundle optical fibers, as well as spectral measurements connected to a microscope. It can accommodate up to three diffraction gratings and is equipped with an electronic controller, allowing connection to a PC via USB cable to perform wavelength shifting and diffraction grating switching using the included dedicated software. 【Features】 ■ Imaging spectrometer with a newly designed optical system ■ Can accommodate up to three diffraction gratings ■ Suitable for multi-point simultaneous spectral measurements ■ Ideal for spectral measurements of observed images ■ Also available in a dual detector switching type *For more details, please refer to the PDF document or feel free to contact us.
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【Specifications (Excerpt)】 ■ Reverse line dispersion: 2.58 nm/mm ■ Optical system: Aberration-corrected special optical system ■ Brightness: F=4.4 ■ Wavelength resolution: Half-width 0.2 nm (within 3 pixels) ■ Stray light: 5×10^-3 or less *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Our company was established in September 1977 as a subsidiary of Japan Spectroscopy Co., Ltd., primarily targeting the research and development departments of universities, government agencies, and corporations. Our goal is to manufacture spectroscopic and optical measurement instruments that faithfully meet customer demands. To date, we have produced numerous unique devices, including solar cell evaluation systems (spectral sensitivity measurement for silicon and dye-sensitized solar cells), spectral response measurement systems (pricing for silicon photodiodes and radiation thermometers), optical element measurement systems (transmission and reflection measurement for lenses and prisms), monochromatic light irradiation systems, and vacuum ultraviolet spectrophotometers.