Simultaneous inspection of the upper and lower surfaces - Appearance inspection device 'TM-2000' after taping.
Visual inspection of storage direction and lead bending through cover tape! Simultaneous inspection of both the top and bottom surfaces is also possible.
Introducing the 'TM-2000' taping post-appearance inspection device handled by Ueno Seiki Co., Ltd. Nagano. This device conducts appearance inspections for electronic components stored in tape, checking for foreign matter, storage direction, lead deformation, etc., while also being able to inspect the bonding state between the cover tape and the embossed tape simultaneously. Additionally, it is positioned for re-inspection in the pre-shipment process and allows for simultaneous inspection of both the top and bottom surfaces. 【Features】 ■ Appearance inspection for foreign matter, storage direction, lead deformation, etc. of electronic components ■ Simultaneous inspection of the bonding state between the cover tape and the embossed tape ■ Simultaneous inspection of both the top and bottom surfaces *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Features】 ■ Touch panel operation (English support available) ■ Retest function (number of times: 0 to 99) configurable ■ Continuous NG alarm issuance function (set number of times: 0 to 99) configurable *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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We design, manufacture, and sell inspection equipment tailored to customer specifications to ensure the reliability and quality of electrical characteristics, appearance dimensions, and shapes of semiconductors and various sensors used in automobiles and communication devices. Additionally, we have developed and manufactured a system called <EYE GATE>, which serves as a gateway connecting the equipment and the server, collecting operational status, image data, production result information, and more from these testing devices.