Simple measurement operations, data storage and management using a PC! A system that allows changes to the measurement display units.
The "PVE-80" adopts the pulse voltage excitation method as its measurement principle, making it a super low-resistance range sheet measurement system that can measure without damaging the sample. It features a space-saving design for the main body casing and a portable, removable stage. Simple measurement operations and data storage/management are achieved through a PC (with dedicated software). Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Uses a measurement method (pulse voltage excitation method) developed in collaboration with Chiba University ■ Capable of measuring without damaging the sample ■ Space-saving design for the main body casing and a portable, removable stage ■ Measurement display units can be changed according to application (sheet resistance, electrical conductivity, electrical conductivity) *For more details, please refer to the PDF document or feel free to contact us.
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【Measurement Specifications】 ■Measurement Targets ・New materials and functional materials (carbon nanotubes, DLC, graphene, silver nanowires, etc.) ・Conductive thin films (metal, ITO, etc.) ・Compound semiconductors (GaAs Epi, GaN Epi, InP, Ga, etc.) ・Others (please inquire) ■Measurement Size: Up to approximately A4 size (W300 x D210mm) ■Measurement Range: 50μΩ to 1mΩ/sq *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.