High reliability and accurate RF/mmW, DC, IV-CV, high power test measurements Signatone probe system.
We offer the manual probe system 'WL-1160' equipped with a steel platen compatible with magnetic or vacuum suction, or fixed RF/DC/HP positioners, with a range of 150mm-200mm. With a robust design and multiple setup and configuration options, it can accommodate various applications. It can be used for a wide range of RF/DC/HP testing. Additionally, quick movement and fine adjustments are possible with the XY stage knob that can be operated with one hand. 【Example Configuration】 - Quick platen lift for platen separation adjustment, chuck micro-rotation, and locking - Multiple configurations available with chuck options, DC/RF/1-10KV micro-positioners, microscopes, cameras, PCB holders, etc. - Instrument racks, vibration isolation tables, thermal chucks, dark boxes, etc., are also available (optional). *For more details, please download the PDF or feel free to contact us.
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basic information
【Specifications (Example: Chuck XY Stage)】 ■ Stage movement range: 203mm x 203mm (8 x 8 inches) ■ Stage movement range (fine adjustment): 12mm x 12mm (0.5 x 0.5 inches) (optional) ■ Movement resolution (fine adjustment): <1um (0.001mm) @ 250um/rev ■ Flatness: <10um ■ θ movement (standard): 360° ■ θ movement (fine rotation): ± 6.0° (optional) ■ θ resolution: gradient 1.5 x 10^-5 ■ Operation: Coaxial gear knob for stage operation * All options may change data depending on configuration. * For more details, please download the PDF or feel free to contact us.
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Company information
Business Activities of Our Company 1. Export of semiconductor testing equipment and electronics control devices Export of semiconductor-related equipment and materials, such as ESD/TLP testers and measuring instruments, and ceramic packages developed and manufactured by domestic suppliers. 2. Import and sales of probe stations (probers) and related equipment As the general distributor in Japan, we handle products from Signatone, a U.S. manufacturer and seller of probe systems.
