High-frequency characteristics of high-speed transmission substrates such as LCP, MPI, and fluorine-based materials compatible with 5G and millimeter waves can be measured on production lines!
For those struggling with the evaluation of high-frequency characteristics: ■ Unsure of the inherent performance of the substrate Due to variations in contact and changes in cable posture, noise occurs, leading to concerns about whether the true performance values are being measured... ■ Time and effort required for characteristic evaluation Evaluating all actual products requires too much labor, but coupon inspections or sampling inspections may overlook defective products... ■ Uncertain if it complies with industry standards End users are requesting characteristic evaluations of high-speed transmission substrates, but it's unclear what measurement methods are considered standard... These issues can be resolved with the measurement device 'MP502', which adapts vector network analyzers for mass production. Please consult with us.
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basic information
High Frequency Characteristic Measurement Device Micro Prober MP502 ■ A complete inspection that overturns conventional concepts We collect all true values and add value to them. We can obtain all measurement data for every product. This not only provides feedback for quality improvement and product development but also supports product warranty. ■ The most important factor is repeatable reproducibility We realize a highly reliable fully automatic measurement system. By controlling the probing position and the amount of pressure within a few micrometers and using a unique mechanism that minimizes movement of the measurement system, we can conduct stable inspections even at high frequencies exceeding 40GHz. ■ Clarifying differences through correct inspection We capture the characteristic changes of all individual pieces. "We have become able to correctly evaluate the correlation with post-implementation inspection." "The difference in measurement results with manual work was greater than expected." "Thanks to accurate inspection, yield has improved." "We were able to discover defects that we had not found before." "We can now understand the true performance of the product." "It seems that measuring in the pre-implementation state will dramatically increase efficiency." For more details, please feel free to contact us.
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Please contact us. Custom orders are available upon request.
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Applications/Examples of results
Target substrates: Rigid substrates with high-speed transmission circuits, flexible substrates, rigid-flex substrates, etc. Measurement items: Insertion loss, reflection loss, VSWR, isolation, characteristic impedance, TDR, etc. Measurement environment: Keysight PXIe multi-port VNA Frequency: 100kHz 44GHz 2port x 4Set *Tests using your own measurement equipment can also be discussed.
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