Non-destructive testing with infrared light
The IR microscope system SK19001-300 is a non-destructive inspection system that uses near-infrared light that passes through silicon wafers, allowing for visual confirmation of defects inside the wafer and the condition of the bonding surfaces on a PC screen.
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basic information
- Infrared Metal Microscope - Manual 12x Zoom - Wideband, High-Sensitivity Near-Infrared Camera (Equipped with Sony's InGaAs SWIR Image Sensor IMX990) - Brighter and longer-lasting near-infrared LED light source compared to general halogen light sources - Manual stage compatible with 300mm wafers - Viewer software for Windows with distance measurement function Customization is available. Please consult us separately.
Price range
P6
Delivery Time
Applications/Examples of results
For checking defects inside the wafer and the condition of the bonding surface.
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Company information
Our company provides unique "technical expertise" in four areas: "Mechanical and ICT Engineering," which offers technical support services and contract development services; "Electronic Engineering," which creates new products through in-house development, joint development, and contract development; "Field Engineering," which handles maintenance for Enefarm; and "Product Development and Sales of Medical Devices." Additionally, we aim to integrate the "technical expertise" from each area and support our customers in solving various challenges with a flexible structure. Please feel free to contact us if you have any requests.
![[Improvement without product] MEMS microscope (dual-side pattern misalignment inspection device)](https://image.mono.ipros.com/public/product/image/4c2/2000416540/IPROS12254321514997502054.jpg?w=280&h=280)
![[Processing Example] Measurement of the processed surface using a white light interference microscope.](https://image.mono.ipros.com/public/product/image/06d/2001179598/IPROS13278746744928103503.png?w=280&h=280)
