Installation of 1 line with 3 channels, and measurement is possible before and after the process! Multi-point film thickness measurement.
Multi-point film thickness measurement capable of pre- and post-measurements in multiple channels. It uses multiple receiving heads to measure the film thickness values at multiple points simultaneously.
The "FF8" allows for non-contact multi-point thickness measurement by measuring the sample's reflectance (interference waveform) and analyzing the thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform measurements and analyses for multilayer films, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. To efficiently measure and analyze differences in film thickness and variations, automatic mapping measurements can be performed using an automatic XY stage. (Mapping film measurement) 【Features】 ■ Measures the sample's reflectance and analyzes thickness values using FFT and other methods ■ Capable of measuring the thickness and refractive index of films and glass in addition to thickness measurement ■ Measurement data can be saved as files and reanalyzed later ■ Can also be used for inline thickness measurement ■ Custom specifications can be accommodated *For more details, please refer to the PDF document or feel free to contact us.
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【Example of Option Configuration】 ■Multilayer Analysis: Analysis of 2 to 10 layers is possible ■Thin Film Analysis (Curve Fitting Method): Analyzing thin films through curve fitting analysis ■Colorimetric Analysis: Conducting colorimetric analysis through reflection and transmission ■Component Concentration Analysis: Enabling multi-component analysis by allowing customers to measure and register any film components themselves ■Microscope Option ■Automatic Mapping Option ■Multi-Point Simultaneous Measurement Option (for 3CH)
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【Applications】 ■Film thickness measurement ■Measurement of the thickness and refractive index of films and glass *For more details, please refer to the PDF document or feel free to contact us.
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From now on, it is expected that various technologies across a wide range of fields will be utilized in various places. To achieve this, we will strive to respond to various scenarios in the fields of research, development, and production. By integrating optics, electronics, mechatronics, and software, we aim to contribute to a wide range of research, development, and production fields centered around "lighting," "materials," and "pharmaceuticals."