Simultaneous inspection of 2pcs LD chips under different temperature conditions! Inspection equipment compatible with DFB, EML, EML + SOA, etc. LD chips.
This product is a full test inspection equipment for LD chips that can be tested from low to high temperatures. It has two inspection stages and can simultaneously test 2 pieces of LD chips under different temperature conditions. It is compatible with LD chips such as DFB, EML, and EML + SOA. When removing chips from the blue sheet, a special method is used to avoid damaging the chips. Please feel free to contact us if you have any inquiries. 【Features】 ■ Supports inspection from low to high temperatures ■ Has two inspection stages ■ Uses a special method to avoid damaging chips when removing them from the blue sheet ■ Supports separation of 4 blue sheets and 8 bins per blue sheet after inspection *For more details, please refer to the PDF document or feel free to contact us.
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We are a global supplier of advanced testing and measurement equipment. We provide high-performance and highly integrated measurement solutions that can support everything from research and development to mass production processes in cutting-edge fields such as high-speed communication, optical chips, electronic measurement, and power semiconductors. Since our founding, we have placed "Dedication and Craftsmanship" at the core of our corporate values, pursuing product development that combines deep insights into measurement principles with a spirit of craftsmanship. Aiming to be "the best testing solution company supporting global technological innovation," we will continue to provide high-performance, high-efficiency, and highly reliable solutions to address global industrial challenges.