Regulating thin film growth! Providing diagnostic tools for real-time process monitoring.
"High-Pressure Reflection High-Energy Electron Diffraction (RHEED)" is high-pressure reflection high-energy electron diffraction. It provides a diagnostic tool for real-time in-situ process monitoring for PLD/PED systems. It adjusts thin film growth based on structural data from intensity and diffraction. 【Features】 ■ Adjusts thin film growth based on structural data from intensity and diffraction. *For more details, please refer to the PDF document or feel free to contact us.
Inquire About This Product
basic information
For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog(1)
Download All CatalogsCompany information
Our company website features information on used equipment related to FPD and semiconductors. ● Main Business Activities Purchase of used semiconductor manufacturing equipment, refurbishment, sales, and setup operations Construction and consulting for semiconductor manufacturing lines Purchase of used FPD manufacturing equipment, refurbishment, sales, and setup operations Construction and consulting for FPD manufacturing lines Contract development, manufacturing, and sales of semiconductor manufacturing equipment and FPD manufacturing equipment Sales of various equipment parts Agency sales of overseas manufactured equipment