Simple positioning operation! It can automatically measure within a specified area on the wafer.
We would like to introduce the "VCSEL Wafer Test System" handled by Fukuhara System. This product can automatically measure the specified area on the wafer with simple positioning operations. It can be utilized for I-L/I-V measurements, spectrum measurements, temperature dependence evaluations of each measurement, and evaluations of optical output/driving current dependence in spectrum measurements. 【The following measurements necessary for VCSEL characteristic evaluation are possible】 (1) I-L/I-V measurement (2) Spectrum measurement *A light spectrum analyzer or spectrometer is required (3) Temperature dependence evaluation of (1) and (2) (4) Optical output/driving current dependence evaluation of (2) *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Configuration】 ■ Measurement Mechanism Unit AT-PRB-VWTS ■ Pulse Stage Controller FTD-6010N ■ LD Drive Power Supply with Temperature Control Function AT-541T ■ Optical Spectrum Analyzer (or Spectrometer) ■ Control PC ■ Measurement Software *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Our company is engaged in the development and manufacturing of industrial equipment using electronic devices. We handle measurement devices (for research and development purposes), inspection equipment, manufacturing equipment, and more. We also offer contract development, so please feel free to contact us if you have any requests.