You can observe the internal structures and defects of semiconductors, electronic components, and organic composite materials by magnifying them.
"That can be seen without breaking it!" is a contracted analysis service that reveals hidden abnormalities. Non-destructive observation methods include magnetic field microscopy that visualizes current paths, ultrasonic microscopy that detects delamination with high sensitivity, and X-ray microscopy (X-ray CT) that allows for three-dimensional observation of internal structures. By combining these methods, it is possible to capture various phenomena. Additionally, high-brightness X-rays enable real-time observation of the water absorption and disintegration state of tablets, and video provision is also possible. Please feel free to contact us. 【Features】 ■ Visible peeling and cracking ■ Visible three-dimensional structures ■ Visible magnetic fields and currents ■ Visible numerical values of interest (particle size, volume, orientation, voids, density) ■ Real-time visibility of shape changes *For more details, please download the PDF or feel free to contact us.
Inquire About This Product
basic information
【Service Flow】 1. Inquiry 2. Quotation 3. Order 4. Analysis 5. Report of Analysis Results 6. Payment *For more details, please download the PDF or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please download the PDF or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.