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  6. High-Resolution Source Measurement Unit Series

High-Resolution Source Measurement Unit Series

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last updated:Jul 08, 2025

Semi Next 本社、三重事業所
Semi Next 本社、三重事業所
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High precision × multi-channel × fast response from 1fA/1μV — The ideal device for research and mass production.

A benchtop SMU (Source Measure Unit) series that balances precision measurement and high-performance output, ideal for research and development and reliability testing. Semight's high-resolution SMU products cover a wide range of voltage and current, from ±200V/±1A (DC) to ±3A (pulse), and even up to ±60V/±10A (pulse), achieving measurement resolutions from a maximum of 1fA/1μV to 10fA/100nV. Equipped with a maximum ADC sampling rate of 1MS/s and a self-developed high-precision, fast-response control system (Adaptive PFC), it supports a wide range of applications from accurate measurement of small signals to high-speed pulse testing.

    Power Supplies
高精度

High-Resolution Source Measurement Unit Series

高精度 bt SMU1.png
高精度 bt SMU1.png 高精度 bt SMU2.png 高精度 bt SMU3.png smu st1.png smu st2.png
  • Source Major Unit Series Official Website
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basic information

- Ultra-high precision measurement: Supports from a minimum of 1fA/1μV to a maximum of 100fA/100nV - Wide output range: ±200V/±3A (up to ±60V/±10A depending on the model) - High sampling rate: Up to 1MS/s (500KS/s depending on the model) - Multi-channel support: Lineup from single/dual to a maximum of 24 channels - In-house developed APFC control: Achieves fast and stable voltage and current control - Pulse testing support: Minimum pulse width of 100μs, supports fast rise times - Flexible application support: Ideal for MEMS, NVM, silicon photonics, power semiconductors, and more

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Applications/Examples of results

The high-precision source measurement unit (SMU) is a device that integrates the functions of a voltage source, current source, ammeter, voltmeter, and electronic load, and is used in a wide range of fields such as discrete semiconductor devices, solar cells, automobiles, batteries, and nano-characterization devices.

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Model number overview
S2035H Single-channel high-precision SMU  · ± 200V/±1A (DC)/±3A (pulse). · Measurement resolution up to 1fA/1μV · Up to 1M ADC sampling rate · Adaptive PFC(Precision-fast control) system
S2036H Dual-channel high-precision SMU  · ±200V/±1A(DC)/±3A(pulse) · minimum measurement resolution 1fA/1μV · Adaptive PFC(Precision-fast control) System · Up to 1M ADC sampling rate
S2021H 4-Channel Precision Source Meter  · ±30 V, ±500 mA (DC/pulsed) · Up to 500K ADC sampling rate · up to 100 pA/100 uV · Resolution up to 100 pA/100 uV · Adaptive PFC (Precision-fast control) System
S2022H 8-Channel Precision Source Meter  · ± 4.5V/±10mA (DC/pulse). · Minimum pulse width 100us ·Up to 500K ADC sampling rate · Adaptive PFC (Precision-fast control) System
S2024H 24 Channel High-precision SMU  · ± 4.5V/±10mA (DC/pulse). · Minimum pulse width 100us · Up to 1M ADC sampling rate · Adaptive PFC (Precision-fast control) System
S2025H single-channel high-precision SMU  · ± 200V/±1A (DC)/3A (pulse). · Up to 1M ADC sampling rate · Resolution up to 10fA/100nV · Adaptive PFC (Precision-fast control) System
S2026H Dual-channel high-precision SMU  · ± 200V/±1A (DC)/3A (pulse). · Up to 1M ADC sampling rate · Resolution up to 10fA/100nV · Adaptive PFC (Precision-fast control) System
S2027H Single-Channel Precision Source Meter  · ±60 V, ±3A (DC), ±10A (pulsed) · Resolution up to 100 fA/100 nV
S2028H Dual-Channel Precision Source Meter  · ±60 V, ±3A (DC), ±10A (pulsed) · Resolution up to 100 fA/100 nV
S3022F Dual-Channel Benchtop SMU S3022F · ± 200V/±3A (DC)/10A (pulse). · Minimum resolution 100fA/100nV · Up to 1M ADC sampling rate · 5.0 inch LCD touch screen
S3012H Single-Channel Benchtop SMU S3012H · ± 200V/±3A (DC)/10A (pulse). · Minimum resolution 100fA/100nV ·Up to 1M ADC sampling rate · 5.0 inch LCD touch screen

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Semi Next 本社、三重事業所

Electronic Components and Semiconductors

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We are a global supplier of advanced testing and measurement equipment. We provide high-performance and highly integrated measurement solutions that can support everything from research and development to mass production processes in cutting-edge fields such as high-speed communication, optical chips, electronic measurement, and power semiconductors. Since our founding, we have placed "Dedication and Craftsmanship" at the core of our corporate values, pursuing product development that combines deep insights into measurement principles with a spirit of craftsmanship. Aiming to be "the best testing solution company supporting global technological innovation," we will continue to provide high-performance, high-efficiency, and highly reliable solutions to address global industrial challenges.

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