S3030F 3500V High Voltage Source Measurement Unit
Single-channel high voltage source measurement unit
±3500V, 10fA resolution - Stable measurement even at ultra-high voltage, ideal for evaluating power devices and SiC/GaN composite materials.
The S3030F is a single-channel source measure unit (SMU) designed for high voltage and high power applications, capable of simultaneous output and measurement of voltage and current in a single unit. It supports a maximum power output of 180W, high voltage of ±3500V, high current of ±120mA (DC), and high resistance measurements of up to 10GΩ, featuring a compact and highly cost-effective design. This product is widely used in research and evaluation applications that require high voltage measurements, such as: ▶ Evaluation of power semiconductor characteristics like GaN / SiC ▶ Electrical testing of insulating materials and composite materials ▶ Measurement of high voltage leakage currents Additionally, the S3030F complies with SCPI commands, making it easy to operate through programming. It also supports synchronized operation of multiple units, allowing integration into evaluation systems such as production lines, contributing to improved measurement efficiency and reduced testing costs.
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basic information
▶ High Output Range Output range: ±3500V, ±120mA (DC), supports 180W ▶ High Resolution Minimum measurement resolution reaches 10 fA / 100 μV, ideal for measuring small currents and voltages ▶ High-Speed Sampling Supports a maximum ADC sampling rate of 1M samples/second (1MSa/s) ▶ Threshold Trigger Support Achieves threshold trigger functionality through high-speed hardware I/O, supporting efficient collaboration with user systems
Price information
Excellent cost performance! Please feel free to contact us.
Delivery Time
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Applications/Examples of results
The S3030F is specially designed for the characterization and testing of high-voltage electronic equipment and power semiconductor devices. It is suitable for devices such as diodes, FETs, IGBTs, and other components or materials that require high voltage, as well as situations where rapid response and accurate voltage and current measurements are needed. The main applications include: - Characterization and testing of power semiconductor devices - Characterization of GaN, SiC, Ga2O3, and other composite materials and devices These devices and materials are particularly critical for high voltage, high-speed response, and precise measurements, making the S3030F an ideal choice.
Detailed information
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DC I-V Output Performance 【Measurement Conditions】 Temperature Condition: 23 °C ± 5 °C Humidity Condition: Relative Humidity 30% to 70% Warm-up Time: Preheat for 60 minutes before measurement Ambient Temperature Variation During Measurement: Ambient temperature variation during measurement should be within ±3 °C Calibration Cycle: Once a year (annual calibration recommended) Measurement Speed: 1 PLC (measurement speed based on power line cycle)
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Company information
We are a global supplier of advanced testing and measurement equipment. We provide high-performance and highly integrated measurement solutions that can support everything from research and development to mass production processes in cutting-edge fields such as high-speed communication, optical chips, electronic measurement, and power semiconductors. Since our founding, we have placed "Dedication and Craftsmanship" at the core of our corporate values, pursuing product development that combines deep insights into measurement principles with a spirit of craftsmanship. Aiming to be "the best testing solution company supporting global technological innovation," we will continue to provide high-performance, high-efficiency, and highly reliable solutions to address global industrial challenges.
