Acquisition of ISO/IEC 17025 laboratory accreditation! Reliable testing services through a controlled environment and established procedures.
This document provides a detailed explanation of the "Contract Analysis Service Reliability Evaluation" conducted by Toshiba Nanoanalysis Corporation. It richly introduces various tests, including temperature cycle tests that apply thermal stress to electronic components to confirm their resistance, and X-ray irradiation tests that evaluate the effects and resistance of materials. Please feel free to consult us when you need our services. [Contents] ■ Reliability Testing ■ Temperature Cycle Testing of Electronic Components ■ Observation of Aging Degradation through Temperature Cycle Testing ■ Observation of Aging Degradation through Thermal Shock Testing ■ X-ray Irradiation Testing ■ Solder Heat Resistance Testing of Surface Mount Components ■ Bond Strength Testing of Semiconductor Packages *For more details, please refer to the PDF document or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.