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  6. Residual stress measurement by XRD.

Residual stress measurement by XRD.

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last updated:Jun 02, 2025

大同分析リサーチ
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Residual stress measurement can be performed non-destructively using XRD.

X-rays are irradiated on the sample to measure residual stress non-destructively. Due to the compact size of the device and its high flexibility in installation locations, it is capable of measuring large samples and conducting field measurements. Additionally, measurements can be taken without changing the angle during the measurement, allowing for quick measurements in a short time (less than 5 minutes).

    Contract measurement
図_XRDによる残留応力測定.jpg

Residual stress measurement by XRD.

図_XRDによる残留応力測定.jpg
図_XRDによる残留応力測定.jpg

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If residual stress exists within the sample, the lattice spacing changes in proportion to the magnitude of the residual stress. This lattice spacing can be determined using Bragg's law from the diffraction angle of the scattered X-rays from the surface of the polycrystalline solid.

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Applications/Examples of results

Measurement of residual stress in circular rings

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Residual stress measurement by XRD

Residual stress measurement by XRD

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Portable residual stress measurement device

Portable residual stress measurement device

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大同分析リサーチ

大同分析リサーチ

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Daitō Analysis Research has been advancing the establishment of an advanced think tank based on highly reliable analysis and analytical techniques accumulated in various material fields, as well as the challenges received from a wide range of industry customers. We aim to solve our customers' various issues with the least cost and the shortest delivery time. Moving forward, we would like to support our customers' research and development using the latest equipment and advanced manpower, and assist in creating products that enrich the future.

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