Conducting magnified observation and elemental mapping using a scanning electron microscope (SEM)! Introducing examples of cross-sectional observation.
We present a case study where we created a cross-section to investigate the plating layer of a car door handle cover, followed by magnified observation and elemental mapping using a scanning electron microscope (SEM). For the plated section, we created a cross-section using ion milling and measured the thickness. The total plating thickness was found to be approximately 11-12 μm, with the thin outermost plating (chrome) measuring about 85 nm, and the second layer of plating underneath measuring about 850 nm. Additionally, the elemental mapping results confirmed that the substrate was a thick copper plating, with nickel plating applied on top of it, followed by chrome plating. [Case Overview] - Investigation Sample: Car Door Handle Cover - Cross-Section Observation: Measurement of Plating Thickness - Elemental Mapping: Investigation of Element Distribution *For more details, please refer to the PDF document or feel free to contact us.*
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Toho Chemical Research Co., Ltd.'s Materials Analysis Department provides analytical and analytical services to assist customers in confirming the quality of their materials and components, as well as solving problems through expanded observation, measurement, composition investigation, and foreign substance analysis. We also assist in evaluating the differences between existing and new products, as well as in thin film evaluation through collaboration with the Ion Plating Department. Our motto is "Together with our customers," and by closely engaging in meetings and information exchange with our clients, we provide solutions to problems and the analytical information they need.