The industry's largest light-receiving area beam profiler with dimensions of 200mm × 200mm. Recommended for measuring large beam diameters and spatially expanding beams.
The Beam Profiler (Beam Profiler) "LaseView-LHB-200" is a model with the industry's largest detection area of 200mm x 200mm. It has made it possible to measure large beam diameters, which was previously difficult. The large diameter and high power compatible Beam Profiler "LaseView-LHB" series is an unparalleled optical product that can measure the largest beams in the world. It is also used for simultaneous emission evaluation of multiple LEDs and semiconductor lasers. This single unit can be used for a wide range of applications. 【Features of the LHB Series】 - Customizable according to application - Easy measurement of beam profiles and beam diameters - Capable of measuring lasers up to large diameters (1 mm to 200 mm) - Capable of measuring lasers up to high power (0.1 W/cm² to 100 W/cm²) - Equipped with a speckle reduction function - Comes with M2 platform software (LaseView) for the beam profiler
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basic information
Receiving surface dimensions: 200 mm × 200 mm Optical resolution: Approximately 400 μm Measurement power density reference: 0.1–100 W/cm² Incident power density: - Total incident power: 10W Allowable incident light angle: ±15° Measurement wavelength range: 400–1100 nm Effective pixel count of CCD: 2448×2048 Acquired image pixel count: 2500×2500 A/D conversion resolution: 8 / 12 bit Frame rate: 38 fps (maximum) Exposure time: 25 μs–4 s Interface: USB3.0 (3.0 Micro B) / GigE (RJ-45) External trigger function: Yes (3.3–12 V / 820 Ω) Power supply: Camera power 5V, approximately 700 mA (supplied via USB), Motor power 6V, below 100 mA (supplied via included AC adapter) External dimensions: W389 × H258 × D268 Weight: Below 8 kg
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Applications/Examples of results
- Measurement of large diameter laser beam profiles - Measurement of high power laser beam profiles - Measurement of beam profiles of lasers with large beam divergence angles - Measurement of the far-field pattern (FFP) of lasers - Measurement of the near-field pattern (NFP) of lasers - Measurement of beam profiles of lasers for processing - Measurement of beam profiles of lasers for laser scalpels - Evaluation measurements of LED CW (continuous) and pulsed light emission - Evaluation measurements of semiconductor laser light emission - Beam evaluation measurements of optical pickups - Measurement of the numerical aperture (NA) of optical fibers - Measurement of beam profiles, beam divergence angles, and propagation losses of lasers for satellite laser ranging devices using telescopes - Application to lens meters - Beam monitoring system for long-distance propagation lasers - Measurement of beam profiles of laser scanning units - Position measurement of scanning lasers - Verification for LiDAR lasers - Evaluation of LiDAR - Measurement of position and beam profiles of RGB laser light sources - Verification for laser projectors
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| Model number | overview |
|---|---|
| LHB-200-GigE | This is a model with a GigE (RJ-45) interface. |
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