Designed to inject electromagnetic pulses into safety-critical circuits with high temporal and spatial resolution.
Product Highlights - Maximum voltage for interference pulse generation is up to 1000 V - Generates two interference pulses continuously within 25 ns - Probe tip with a coil diameter of 250 µm (depending on the model)
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basic information
Hardware fault injection is known as an established potentially dangerous method for cracking security-protected systems. Electromagnetic fault injection (EMFI) exposes the targeted system to localized magnetic field pulses, which can lead to physical disruption of the device or logical errors. Unlike software attacks that exploit vulnerabilities that rarely occur, hardware attacks can occur independently of these vulnerabilities, making them more likely to succeed against a larger number of targets. One of the key features of the new pulse probe is its extended voltage range used to generate disruption pulses, allowing for voltages up to 1000 V (significantly increasing disruption power), which can uncover new vulnerabilities. The second important feature is the ability to release two disruption pulses within a minimum of 25 ns, enabling successful attacks on enhanced systems against a single disruption event. The ICI-DP probe from Langer EMV-Technik provides the highest pulse power, allowing for detailed analysis and robust protection of devices.
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Applications/Examples of results
- Electromagnetic Fault Injection (EMFI) - EM Pulse Coupling - IC Security / Embedded Security - Advanced attacks possible using double pulse sequences
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| Model number | overview |
|---|---|
| ICI-DP HH1000-15 | Probe head dimensions: Diameter 1000µm Rise time: 2 nanoseconds Minimum double pulse sequence time: 25 nanoseconds (200V) Polarity (set via software): +/- Voltage: 50-1000V Maximum jitter (standard): ±1 nanosecond Minimum trigger pulse delay: 35 nanoseconds |
| ICI-DP HH500-15 | Probe head dimensions: Diameter 500µm Rise time: 2 nanoseconds Minimum double pulse sequence time: 25 nanoseconds (200V) Polarity (set via software): +/- Voltage: 50-1000V Maximum jitter (standard): ±1 nanosecond Minimum trigger pulse delay: 35 nanoseconds |
| ICI-DP HH250-15 | Probe head dimensions: Diameter 250µm Rise time: 2 nanoseconds Minimum double pulse sequence time: 25 nanoseconds (200V) Polarity (set via software): +/- Voltage: 50-1000V Maximum jitter (standard): ±1 nanosecond Minimum trigger pulse delay: 35 nanoseconds |
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Company information
As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly sophisticated electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high levels of safety and reliability. We aim to provide new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.