PMI Inspection - On-site Material Identification - Emission Spectral Analysis and X-ray Fluorescence Analysis
To prevent accidents such as mistakenly using different materials during on-site material identification, measurements can be taken using either luminescence spectroscopy or X-ray fluorescence analysis.
This is a measurement technology necessary to prevent accidents such as mistakenly using different materials during on-site material identification. IHI Inspection Measurement (IIC) is capable of performing both photoluminescence spectroscopy and X-ray fluorescence analysis.
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Leveraging the technological expertise cultivated through IHI's manufacturing, we provide comprehensive one-stop total coordination of inspection, measurement, and system technologies.