In the investigation of the discoloration of metal components, qualitative analysis of the surface condition and evaluation using XPS of the thickness and depth distribution of the surface oxide film are very effective!
We would like to introduce the XPS analysis of the discolored copper material surface. The causes of copper discoloration can be due to the formation of corrosion products, as well as differences in the thickness of the surface oxide film (resulting in color changes due to light interference phenomena). Therefore, in addition to qualitative analysis of the very surface using X-ray photoelectron spectroscopy (XPS), conducting depth profile analysis is also effective. In the attached PDF document, we present a case study where qualitative surface analysis and depth profile analysis of the copper material were conducted, comparing the discolored areas with the normal areas. Please take a look. [Evaluation of Copper Surface Discoloration] ■ Conducting depth profile analysis in addition to qualitative analysis of the very surface using X-ray photoelectron spectroscopy (XPS) is effective. *For more details, please download the PDF or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.