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  6. Phase analysis by FE-EPMA

Phase analysis by FE-EPMA

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last updated:Jun 02, 2025

大同分析リサーチ
大同分析リサーチ
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By phase analysis using FE-EPMA, it is possible to visualize the distribution of each phase in the material and clarify the fine phase structure.

Phase analysis using an electron probe microanalyzer (EPMA) is a method that details the elemental concentration distribution of materials and calculates the composition ratios to clarify the types and distribution of existing phases. The analysis utilizes dedicated software called "Phase Map Maker." Based on the elemental map data obtained from EPMA, it outputs a scatter plot representing the X-ray intensity of elements as a two-dimensional histogram. In this scatter plot, measurement points belonging to the same phase form closely clustered groups, allowing for the intuitive creation of phase maps that indicate phase distribution by specifying those areas. Phase analysis using FE-EPMA allows for the simultaneous display of multiple different phases on a single phase map, enabling a quick grasp of the distribution of each phase and facilitating rapid analysis of the elements causing material properties or phenomena, thereby contributing to problem-solving and quality improvement.

    Contract Analysis
メイン画像_FE-EPMAを活用したスラグの相組成評価.jpg

Phase analysis by FE-EPMA

メイン画像_FE-EPMAを活用したスラグの相組成評価.jpg
メイン画像_FE-EPMAを活用したスラグの相組成評価.jpg

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Electron Probe Micro Analyzer (EPMA) JXA-iHP200F, manufactured by JEOL Ltd. - Analyzable element range: WDS: B~U, EDS: Be~U - X-ray spectral range: WDS spectral range: 0.087~9.3 nm EDS energy range: 20 keV - Number of X-ray spectrometers: WDS: 1~5 selectable, EDS: 1 - Maximum sample dimensions: 100 mm × 100 mm × 50 mm (H) - Acceleration voltage: 1~30 kV (0.1 kV step) - Irradiation current range: 1 pA~3 μA - Irradiation current stability: ±0.3%/h, ±1.0%/12h - Secondary electron resolution: 2.5 nm - Analysis conditions: 20 nm (10 kV, 10 nA) Secondary electron resolution: 50 nm (10 kV, 100 nA) - Scanning magnification: ×40~300,000 (W.D 11 mm) - Scanning resolution: up to 5,120 × 3,840

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Phase analysis using FE-EPMA is a powerful tool for understanding the microstructure of materials in detail. It can be utilized in a wide range of fields and strongly supports material development and quality control. Please make use of phase analysis with FE-EPMA for improving the performance of your products, investigating the causes of defects, and developing next-generation materials.

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大同分析リサーチ

大同分析リサーチ

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Daitō Analysis Research has been advancing the establishment of an advanced think tank based on highly reliable analysis and analytical techniques accumulated in various material fields, as well as the challenges received from a wide range of industry customers. We aim to solve our customers' various issues with the least cost and the shortest delivery time. Moving forward, we would like to support our customers' research and development using the latest equipment and advanced manpower, and assist in creating products that enrich the future.

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