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  6. DCA1065 Sampling Oscilloscope

DCA1065 Sampling Oscilloscope

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65GHz sampling oscilloscope for 1.6T optical transceiver testing

last updated:Jul 12, 2025

Semi Next 本社、三重事業所
Semi Next 本社、三重事業所
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Semight DCA1065 Sampling Oscilloscope — Fully meets the testing needs of the 1.6T optical module!

The 200Gbps per lane data rate not only achieves higher bandwidth but also significantly contributes to power consumption reduction. On the other hand, evaluating such high-speed signals requires extremely advanced measurement techniques. Semight has developed the "DCA1065," a wideband sampling oscilloscope that employs a newly designed ASIC compatible with 200Gbps per lane, addressing the challenges of high-speed signal measurement. With the System Impulse Response Correction (SIRC) function, it can flexibly respond to signal measurement requirements under various data rate conditions. Additionally, it supports up to 64 taps in the feedforward equalizer (FFE) for TDECQ, effectively reducing inter-symbol interference (ISI).

    oscilloscope
DCA1065.png

DCA1065 Sampling Oscilloscope

DCA1065.png
DCA1065.png DCA1065 2.png DCA10653.png
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basic information

■High-efficiency measurement Supports 100GBd PAM4 signal eye diagram measurement for up to 4 channels ■Multifunctional measurement Fully compliant with NRZ and PAM4 eye diagram measurement requirements Capable of measuring high-speed signals at 200Gbps per lane ■Automatic testing function Enables quick and efficient operation through remote command control mode ■High-precision performance guarantee Ensures measurement consistency and reproducibility with high-performance hardware

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Excellent cost performance! Please feel free to contact us.

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Applications/Examples of results

Evaluation and implementation are already underway with top-class companies in the industry, and they are actively adopting it.

Detailed information

  • DCA 1065 4.png

    ■ Multi-Port Integrated Design **Compact design (half-rack width)** significantly saves installation space Supports 1/2/4 channel configurations, enabling flexible system construction.

  • DCA1065 5.png

    ■ TDECQ (Transmitter and Dispersion Eye Closure Quaternary) Measurement TDECQ is measured based on two vertical histograms on the eye diagram. These histograms are ideally centered at 0.45 UI and 0.55 UI, maintaining a spacing of 0.1 UI. The width of each histogram window is 0.04 UI, covering all modulation levels. The point of the measurement is to fine-tune the position of the histograms to obtain the minimum TDECQ value. The figure below shows an image of the TDECQ measurement window.

  • DCA1065 6.png

    ■ OMA (Outer Optical Modulation Amplitude) Measurement OMA (Outer Optical Modulation Amplitude) is defined as the difference in optical power levels P₃ and P₀ at the center of two UIs within a **specified pattern (seven consecutive "3"s and six "0"s)**. The calculation formula is as follows:

  • DCA1065 8.png

    ■Measured example of 106GBd PAM4 signal A screenshot of the SSPRQ eye diagram waveform of the 106GBd PAM4 signal measured by the DCA1065.

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News about this product(1)

1.6T High-Speed Interface Evaluation Solution

Semight officially releases an integrated testing solution for next-generation computing interfaces compatible with 1.6T, scheduled for its first domestic exhibition at COMNEXT 2025.

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Semight has officially released a 1.6T high-speed interface evaluation solution that supports AI accelerated computing and CPO. This solution consists of three main measurement instruments: ▶ DCA1065 Sampling Oscilloscope ▶ CR3302 Clock Recovery Unit ▶ PBT3058 Bit Error Rate Tester It provides high-precision and end-to-end measurement support for the development of next-generation AI optical interconnects, contributing to overcoming industry bottlenecks in high-speed data communication. As a world-leading provider of 1.6T high-speed interface test solutions, Semight is already collaborating with major optical communication manufacturers and advanced chip vendors for joint verification. We have also begun active expansion in the Japanese market, intensifying our product offerings and technical support. This product is scheduled to be showcased for the first time in Japan at COMNEXT (Tokyo Big Sight) from July 30 to August 1, 2025. We invite everyone interested in AI, CPO, and 1.6T evaluation to experience it at the venue. For product materials and demo inquiries, please contact sai@semi-next.co.jp.

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Semi Next 本社、三重事業所

Electronic Components and Semiconductors

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We are a global supplier of advanced testing and measurement equipment. We provide high-performance and highly integrated measurement solutions that can support everything from research and development to mass production processes in cutting-edge fields such as high-speed communication, optical chips, electronic measurement, and power semiconductors. Since our founding, we have placed "Dedication and Craftsmanship" at the core of our corporate values, pursuing product development that combines deep insights into measurement principles with a spirit of craftsmanship. Aiming to be "the best testing solution company supporting global technological innovation," we will continue to provide high-performance, high-efficiency, and highly reliable solutions to address global industrial challenges.

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