Near Field Probe Set XF1
The "XF1" set includes the H-field probes "XF-R 400-1", "XF-R 3-1", "XF-B 3-1", "XF-U 2.5-1", and the E-field probe "XF-E 10". It is designed for magnetic field measurement in electronic assembly, components, and IC pins. Each frequency range is from 30MHz to 6GHz, allowing for the location measurement of sources of HF electromagnetic fields and the origins of interference. The probes can be connected to the 50Ohm input of a spectrum analyzer via SMA.
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"Main Features" ◆ Frequency range: 30MHz to 6GHz * "XF-E" is 30MHz to 3GHz ◆ "XF-R 400-1": With a diameter of 25mm, it has very good sensitivity and can perform minimal analysis. The probe can be used at a distance of up to 10cm from the device. ◆ "XF-R 3-1": Capable of detecting most point-like HF electromagnetic fields. The probe can analyze electromagnetic fields in the millimeter range. ◆ "XF-B 3-1": Designed for detecting electromagnetic fields emitted vertically from flat device surfaces. The probe allows measurement of obstructed areas on printed circuit boards. ◆ "XF-U 2.5-1": Designed for detecting the flow spectrum of extremely small conductive paths, component connections, capacitors, and IC pins. The probe head is approximately 0.5mm wide and includes effective regulations by magnetism. ◆ "XF-E 10": The probe head chip is only about 0.5mm wide. It can achieve a resolution of about 0.2mm, allowing individual tracks to be evaluated on the design blueprint.
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As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly sophisticated electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high levels of safety and reliability. We aim to provide new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.
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