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  6. Contracted services for scanning electron microscope observation | JTL

Contracted services for scanning electron microscope observation | JTL

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Observation Analysis > Observation Service > Surface and Cross-Section Observation > Scanning Electron Microscope Observation

last updated:Jul 22, 2025

JAPAN TESTING LABORATORIES
JAPAN TESTING LABORATORIES
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We will conduct surface morphology observation at high magnification using SEM/FE-SEM.

In the scanning electron microscope observation service, high-magnification morphological observation of the sample surface is conducted using SEM and FE-SEM. In SEM observation, it is possible to observe not only the surface roughness but also the distribution of composition and the state of crystalline particles. FE-SEM observation allows for higher magnification than scanning electron microscopy (SEM), and crystal orientation analysis using EBSD can also be performed. Additionally, elemental analysis can be conducted using EDX, which is attached to SEM/FE-SEM. At JTL, we also accept services related to necessary processes before and after observation and analysis using SEM/FE-SEM, such as evaluation tests, cross-section polishing, and dimensional measurements.

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Contracted services for scanning electron microscope observation | JTL

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  • Related Link - https://jtla.co.jp/service/analysis/physical-alana…

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【Observation from low magnification to high magnification (approximately 300,000 times)】 We have not only a general-purpose SEM but also a FE-SEM equipped with a field emission electron gun, allowing for a wide range of observations from low magnification (a few times) to high magnification (approximately 300,000 times). If you require observations at even higher magnifications, we also offer TEM observation services. 【Observation of large samples】 The observation range for the general-purpose SEM is φ180mm×t70mm, but the sample size that can be loaded into the device is approximately φ300mm×t70mm. The sample dimensions that can be observed with the FE-SEM are up to 70×50×t25mm. 【Observation in low vacuum mode】 The general-purpose SEM can observe in low vacuum mode, making it possible to conduct SEM observations on samples that easily release gas, samples that tend to charge even after deposition, and samples that are difficult to observe without deposition (such as insulators or samples containing water or oil). 【Elemental analysis using EDX (Energy Dispersive X-ray Spectroscopy)】 Both the SEM and FE-SEM are equipped with EDX, allowing for the investigation of the types, quantities, and distribution of elements that make up the sample surface.

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The price varies depending on the observation details, so please feel free to contact us.

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※The delivery date may vary depending on the observation details, so please feel free to contact us.

Applications/Examples of results

- Cross-sectional observation of the melted area in the weld - Observation of the crystalline state of metallic materials - Cross-sectional observation and analysis of plating - Observation and analysis of solder joints - Observation of microcracks in ceramic materials - Crystal orientation analysis using EBSD - Analysis of crystal structure around the damaged area of the metal plate - Analysis of crystal structure in the plating of the crimped area - Crystal orientation analysis around cracks within grains - Analysis of changes in crystal structure before and after solder testing - Analysis of crystal orientation in ceramic products - Analysis of crystal structure in the damaged area of the weld - Others - Observation and analysis of contaminants and foreign materials - Observation and analysis of rust occurrence - Observation of fracture surfaces of metallic materials - Confirmation of the ingress state of corrosive liquids in metal products - Shape confirmation and processing rate measurement of terminal crimped areas - Surface and cross-sectional investigation of welded products (laser, TIG, arc, spot, resistance, etc.) - Surface and cross-sectional investigation of heat-treated products (high frequency, annealing, TIC, carburizing, vacuum, etc.)

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JAPAN

JAPAN TESTING LABORATORIES

Testing, Analysis and Measurement

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Our main business is providing technical services to evaluate the reliability of developed products. We not only provide evaluation data in accordance with standards and regulations, but also propose optimal methods, conditions, and equipment for evaluation purposes, as well as design and manufacture original equipment and jigs for non-standard evaluations. Additionally, we handle three evaluation techniques—measurement, testing, and analysis—comprehensively, allowing us to offer complex services that span diverse equipment and suggest more multifaceted evaluation methods.

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