X-ray Transmission Observation Service | JTL
Observation Analysis > Observation Services > Non-Destructive Internal Structure Observation > X-ray Transmission Observation Services
We observe the internal structural condition of products and parts non-destructively through X-ray transmission.
【Minimum focal dimension: High-resolution observation at 0.25μm】 Due to the minimum focal dimension being 0.25μm (theoretical value), high-resolution observation in the range of several microns to several tens of microns is possible. 【X-ray tube voltage: Wide range of penetration power from 30kV to 160kV】 The X-ray tube voltage varies from 30kV to 160kV, allowing for a wide range of observations depending on the sample size and evaluation purpose. 【Observation from multiple directions】 The detector (I.I. tube) can tilt up to 70°, and the sample can rotate 360° around its center, enabling observation from multiple directions without compromising high magnification. 【Automatic inspection of multiple samples is possible】 By using a large table and an automatic imaging program, it is possible to automatically capture images of multiple samples and sort defective products.
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basic information
The X-ray transmission observation service allows for the observation, inspection, and measurement of the internal structure of samples through non-destructive observation using X-rays. This method is commonly used for failure analysis of electronic components and assembled parts. At JTL, we cater to a wide range of needs, from internal structure observation to the inspection of multiple defects in various materials, components, and product shapes, in addition to electronic devices. 【Structure of the X-ray Transmission Device】 X-rays are a type of electromagnetic wave, similar to radio waves and sunlight. Electromagnetic waves have the property of traveling in a straight line while maintaining a certain wavelength through air and materials. Additionally, due to their short wavelength, they can penetrate materials; dense substances are harder to penetrate, while less dense substances are easier to penetrate. X-rays are generated from an X-ray tube, and the X-rays that pass through the sample are converted into a visible light image using an I.I. tube for observation.
Price information
The price varies depending on the observation details, so please feel free to contact us.
Delivery Time
※The delivery date may vary depending on the observation details, so please feel free to contact us.
Applications/Examples of results
- Confirmation of the bonding state of various electronic devices (chip components, BGA, etc.) and measurement of void ratio, etc. - Confirmation of wire bonding disconnections and measurement of wire flow rate. - Verification of the wiring pattern on the substrate. - Investigation of internal voids in resin materials. - Confirmation of the orientation of glass fibers within resin materials (partial verification possible). - Inspection for foreign materials inside resin and ceramic materials. - Investigation of internal voids in aluminum castings. - Confirmation of the fit state of assembled components (such as crimping condition). - Defect inspection of mass-produced items (measurement of multiple units through program creation).
Company information
Our main business is providing technical services to evaluate the reliability of developed products. We not only provide evaluation data in accordance with standards and regulations, but also propose optimal methods, conditions, and equipment for evaluation purposes, as well as design and manufacture original equipment and jigs for non-standard evaluations. Additionally, we handle three evaluation techniques—measurement, testing, and analysis—comprehensively, allowing us to offer complex services that span diverse equipment and suggest more multifaceted evaluation methods.
![[Analysis Case] Non-destructive 3D Structural Observation of SiC Discrete Packages](https://image.mono.ipros.com/public/product/image/507/2000436241/IPROS15768870373445412704.jpg?w=280&h=280)
