A spectrometer for high-speed spectral measurement in a size that is easy to embed in devices.
The ultra-compact spectroscopic body is equipped with quartz optical fibers, allowing for measurements without being limited by location. Each detection component is molded using Carl Zeiss's unique technology, ensuring no malfunctions and no need for calibration. It is also easy to use online, with the capability to connect to various interfaces. By using a microscopic optical system, measurements can be taken in fine areas, and conversely, accommodating larger measurement objects can be achieved seamlessly through multi-channel measurements or in combination with dedicated actuators.
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basic information
The existence of a unit for spectroscopic measurement within a size of approximately 70×60×40mm³ is a technology that was previously unimaginable. This has been realized by the German company Carl Zeiss. As a result, it has become extremely easy to incorporate light detection into various spectroscopic measurement devices for OEM integration and quality monitoring in factory automation. It is resistant to temperature changes, condensation, and vibrations, and has withstood 50G of gravity inside a space shuttle. This is an ultra-compact spectrometer that overturns conventional wisdom.
Price information
List price: 297,000 yen and up. Orders can be placed from one unit.
Price range
P3
Delivery Time
P2
Applications/Examples of results
Color measurement (color measurement management within offset printing machines, color evaluation of printed materials, paper, ink, and liquids, colorimetric calculations) film thickness measurement (high-speed thickness measurement of transparent/translucent films such as SiO2 films, photoresist films, dielectric films, film thickness on wafers, oil films, etc.) light emission measurement (plasma monitoring in semiconductor processes, solar light measurement, infrared light transmission/reflection measurement of optical communication devices, light measurement of PDP and EL) non-destructive measurement (measurement of sugar content/acidity in food, soil testing, etc.) wavelength measurement (high-precision wavelength measurement at the time of shipment for LDs and laser pointers)
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Company information
Mainly utilizing optical measurement, devices for various non-destructive, non-contact measurements and semiconductor manufacturing process inspections (such as film thickness measurement and plasma monitoring) are developed for both online and offline use.