Tension pickup
The tension sensor 3FB-2000N is a pickup that measures the tension of tape and film during operation. It is a product that applies strain gauges and has a structure similar to load cells, providing very stable measurement values. It is used in conjunction with a separately sold tension analyzer. It can accurately capture tension fluctuations of tape and film in operation, and when combined with a digital tension analyzer, it allows for NO/GO judgment, data recording, and graph analysis. In addition to the 3FB-2000N (tape width 40-60mm, tension 0-20N, response frequency 100Hz), there are more than 20 models available, allowing for the selection of pickups according to various tape widths and tensions. Custom-built types that can be built into various running devices such as printers are also available.
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basic information
The tension sensor 3FB-2000N is a pickup that measures the tension of tape and film during operation. It is a product that applies strain gauge technology and has a structure similar to that of load cells, providing very stable measurement values. It is used in conjunction with a separately sold tension analyzer. It can accurately capture tension fluctuations of tape and film in motion, and when combined with a digital tension analyzer, it allows for NO/GO judgment, data recording, and graph analysis. In addition to the 3FB-2000N (tape width 40-60mm, tension 0-20N, response frequency 100Hz), there are more than 20 models available, allowing for the selection of pickups according to each tape width and tension. Custom-built types that can be built into various running devices such as printers are also available.
Price information
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Applications/Examples of results
Battery-related film Magnetic tape Packaging film Pharmaceutical film Winding machine control
Company information
At Okura Industry Co., Ltd., in addition to wafer edge profile measurement devices, we design, manufacture, and sell optical and mechatronic equipment such as laser microscopes. We can provide custom solutions for automatic inspection devices and observation evaluation devices that utilize microscopes, flexibly accommodating optimal wavelengths, fields of view, inspection methods, and software for inspections.
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