Tester that allows for easy implementation inspection of boards equipped with CSP, BGA, and MCM.
● Automatically generates and inspects boundary scan test patterns based on PC. ● Capable of pin-level defect analysis such as solder bridges and opens (ScanPlus and Runner ADO options). ● The inspection functions include the following: - TAP Integrity - Interconnect - Buswire - Cluster - Memory and FIFO device testing Comprehensive technical support! We can handle everything, including fixtures.
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basic information
The emergence of narrow pitch leads and ball grids has made it difficult to access SMT devices such as CSP, BGA, and MCM with test probes, leading to the reliable detection of implementation defects on mounted boards. The JTAG test tools include ScanExpress TPG (test program development software), ScanExpress Runner (test execution software), and ScanExpress ADO (failure analysis software), and a controller (I/F) is required for connection to the board.
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Applications/Examples of results
Inspection of mounting defects on high-density printed circuit boards equipped with JTAG-compatible devices (compliant with the IEEE 1149.1 standard). In particular, it demonstrates significant capabilities in the industrial electronics sector, including testing for communication equipment, commercial copiers, medical electronic devices, servers, and CPU boards.
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Company information
The electronics industry is experiencing fierce developments towards speed, cost performance, communication, labor saving, originality, and the creation of new value. We are committed to contributing to the improvement of product completeness by resonating with our customers on the front lines, through proposals for various board inspection equipment, the development of function testers, and the development and manufacturing of various jigs (fixtures).
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