Measuring the temperature of a high-reflective substrate from low temperature (50°C) to high temperature (500°C).
◆ The temperature of the high-reflective substrate after thin film coating can be measured from low temperature (50°C) to high temperature (500°C). ◆ There is no error up to an angular deviation of ±5 degrees. ◆ The measurement distance can be maintained between 80 to 110 mm.
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◆ The temperature of the high-reflective substrate after thin film coating can be measured from low temperature (50°C) to high temperature (500°C). ◆ There is no error up to an angle deviation of ±5 degrees. ◆ The measurement distance can be maintained between 80 to 110 mm.
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At Matsumoto Metal Industry Co., Ltd., we aim to be a company that can contribute to a prosperous future, starting from our commitment to joyfully respond to each user's needs.
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