An optical thin film measurement device that combines reflectance spectroscopy and curve fitting methods.
Optical thin film measurement device combining reflectance spectroscopy and curve fitting method ■□■Features■□■ ■By analyzing the reflection from the interface between the surface of a transparent or translucent thin film and the substrate, analysis can be easily performed in just a few seconds. ■In addition to measuring film thickness, this single device can also measure optical constants, allowing for the registration of original materials and operation tailored to the user's applications. ■A powerful and simple low-cost system. ■For more details, please download the catalog or contact us.
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Optical thin film measurement device combining reflectance spectroscopy and curve fitting method ■□■Features■□■ ■By analyzing the reflection from the interface between the surface of a transparent or translucent thin film and the substrate, analysis can be easily performed in a few seconds. ■In addition to film thickness, the measurement of optical constants can also be performed with this single device, allowing for the registration of original materials and operation tailored to the user's applications. ■A powerful and simple low-cost system. ■For more details, please download the catalog or contact us.
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Applications/Examples of results
■□■Application■□■ ■Photoresist ■Oxide film ■Nitride film ■Functional film ■Optical film ■Various protective films ■ITO film ■DLC film ■Other organic thin films, etc.
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In the field of measurement, analysis, and inspection equipment, our job is to collect advanced technology information from overseas and provide it to our customers, as well as to import excellent advanced technology products. We integrate these with hardware and software developed by ourselves, along with services, and offer them as solutions to our customers. We believe that our unwavering responsibility in this changing era is not just to introduce overseas technological products, but to discover outstanding core technologies that can achieve coexistence between "technology and humanity" and "society and the global environment," and to shape them into solution systems.