A tabletop optical interference real-time film thickness monitor that allows for easy measurement of film thickness. Capable of measuring film thickness from 10 nm to 50 μm. Since it is a spectrometer, it can also perform various other measurements.
A compact and user-friendly spectrometer system that allows for easy measurement of thin film thickness on a tabletop. The spectrometer can also be used for laser measurements and various other applications by simply changing the fiber, which is an attractive feature. Measurements are taken using the interference pattern of white light reflected from the sample, and the software calculates the n and k values from a database. Configuration: ● Spectrometer: AvaSpec-ULS2048CL-EVO ● Light source: AvaLight-DHc ● Software: AvaSoft-thinfilm ● Fiber: FCR-7UV200-M ● Accessory: Thinfilm Stage These components can be controlled from a PC to measure film thickness from 10 nm to 50 μm with a resolution of 1 nm.
Inquire About This Product
basic information
A film thickness monitor that can measure the thickness of various thin films non-contact and in real-time. 【Features】 ○ It can measure film thickness from 10 nm to 50 μm with a resolution of 1 nm. ○ By observing the interference pattern of white light reflected from the measurement sample and using the physical properties of the thin film material, it is converted into optical film thickness. For single-phase films, if the material's n-value and k-value are known in advance, the film thickness can be calculated. ○ The dedicated software includes a database of commonly used materials and coating materials' n-values and k-values, allowing for selection based on the measurement target.
Price information
-
Delivery Time
Applications/Examples of results
Measurements are taken using the interference pattern of white light reflected from the measurement sample. Example configuration: ● Spectrometer: AvaSpec-ULS2048CL-EVO ● Light source: AvaLight-DHc ● Software: AvaSoft-thinfilm ● Fiber: FCR-7UV200-M ● Accessory: Thinfilm Stage These can be controlled from a PC to measure film thickness from 10 nm to 50 μm with a resolution of 1 nm.
catalog（1）
Download All Catalogs
Company information
Our company started with the import and sales of laser oscillators and optical devices and components, and has developed through the import and sales of innovative and original electronic optical devices from around the world, as well as the provision of advanced technical services. Our main products include a variety of laser light sources ranging from semiconductor lasers to nano, pico, and femtosecond lasers, along with various devices and measurement instruments for their adjustment and control. In the field of optical spectroscopy and analysis, we provide high-performance multi-spectral fiber-coupled spectrometers and their application measurement systems (color, luminescence, absorption, Raman spectroscopy, fluorescence, plasma, LIBS, etc.), as well as thermal imaging IR cameras. Furthermore, in response to the development of thin film technology, we handle thin film measurement instruments such as thin film adhesion strength testers and optical interference film thickness monitors. Moving forward, we will enhance various applications and after-sales services to respond quickly to user demands. We will continue to firmly establish ourselves in the fields of light and nanotechnology, adapting to market trends, and aim for further development as a frontier trading company that serves everyone.
