It is a device for measuring the I-V curve characteristics of solar power generation systems ranging from 50W to 10kW.
This device measures the current-voltage characteristics (I-V curve), which is important for evaluating the performance of solar cells, and is ideal for assessing the performance of solar power systems ranging from large solar cell modules over 100W to 10kW. Compared to previous I-V curve tracers, it is compact and lightweight (A4 size, 2.8kg), and does not require a computer for measurements; you can simply operate the built-in keyboard, and the LCD display shows the I-V curve, Voc, Isc, Pm, etc., allowing for immediate performance evaluation, making it extremely convenient for field measurements. The measured data can be stored in the internal memory for up to 70 readings, and you can freely read or delete them, so you can use it with confidence even when a lot of data is required. The solar cell input terminals adopt a four-terminal input method, ensuring high measurement accuracy while also implementing sufficient safety measures for human beings. By using the optional Windows 98-compatible measurement and analysis software, it can also support text saving, standard state conversion, and automatic continuous measurements.
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basic information
This is a device for measuring the I-V curve characteristics of solar power generation systems ranging from 50W to 10kW. It is compact and lightweight, allowing for easy operation to measure solar cell output within 5 seconds, and it can store data for 70 measurements in its internal memory.
Price information
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Delivery Time
P4
Applications/Examples of results
It can be used for operational checks after the installation of the solar power generation system and for regular maintenance.
Company information
Eihon Seiki has always built its 90-year history with a spirit of "proactive innovation." Today, as a company supporting research institutions around the world, it is globally expanding its business with the themes of "environment and new energy" and "material property analysis."