Seminar Materials: Challenges and Solutions in Ultra-Fast Interfaces and Measurement
Ultra-high-speed interfaces, measurement challenges and solutions - USB 3.0, PCI Express Gen 3, SATA Gen 3.
This is an announcement of the ET-WEST2009 seminar materials from Lecroy Japan, which proposes the best measurement devices, measurement methods, repairs, maintenance, upgrades, and purchasing plans in collaboration with users, focusing on "High-Speed Interfaces, Measurement Challenges, and Solutions." Presentation materials from the Embedded Comprehensive Technology Exhibition AD-1 These are the seminar materials presented by our Product Marketing Manager at the Analog Track AD-1 of the Embedded Comprehensive Technology Exhibition held in Osaka on June 5. It explains the trends of the latest serial interface standards such as USB 3.0, Serial ATA 3.0, and PCI Express Gen 3, as well as the analysis functions required for measurement instruments.
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• Key points of high-speed interfaces – Examples include USB3.0 (SuperSpeed), SATA3.0, and PCI Express Gen2 • Challenges in high-speed signal measurement – Taking the measurement of USB3.0 (SuperSpeed) signals as an example
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Teledyne LeCroy Japan, Inc. was established on September 14, 1990, as a wholly-owned subsidiary of Teledyne LeCroy Corporation (New York, USA). We have set up sales offices and support centers in Tokyo and Osaka to meet the needs of our customers in Japan. On November 16, 2001, we obtained ISO 9001:2000 certification. We aim to contribute to our customers' product development and problem-solving by providing technical documentation, analysis software, and technical seminars in Japanese free of charge.