List of Measurement and Analysis products
- classification：Measurement and Analysis
676～720 item / All 52910 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
Active in the chemical industry! Avoid missing non-volatile compounds.
- Analytical Equipment and Devices
Introduction to the features of the Vanquish Core HPLC system for routine analysis.
- Analytical Equipment and Devices
A reliable HPLC system that supports stable routine analysis.
- Analytical Equipment and Devices
Improved performance and reproducibility! Experience the UHPLC technology designed for flexibility.
- Analytical Equipment and Devices
High-speed stability and ultra-durable design within 1 second! A lineup of high-precision counting scales.
- Scale
Improving safety, efficiency, and productivity in food weighing!
- Scale
New EXPLORER Launch Campaign
This is an announcement regarding a campaign to celebrate the release of the new EXPLORER balance. The Ohaus balance, EXPLORER, has been renewed, significantly improving its accuracy, functionality, and operability. When you place an order for the new EXPLORER, we will issue a "coupon." This coupon can be used for special pricing on your next order of Ohaus laboratory equipment (such as shakers, vortex mixers, etc.), pH meters, and portable turbidity meters. The campaign period is from orders placed on October 1, 2025, to orders placed on December 26, 2025.
A versatile ultraviolet-visible spectrophotometer that can be widely utilized in research and development, routine analysis, education, and industrial fields.
- Spectroscopic Analysis Equipment
Three key points to keep in mind for HACCP compliance.
- Scale
Usable in various scenes! It features detachable connector that make wiring work easy!
- Sensors
- Other electronic measuring instruments
It is a PC-based surface defect inspection system with excellent scalability.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
Since the camera, lighting, and image processing device are integrated, it is possible to install and inspect them compactly.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
Achieving high-precision inline measurement from 2D shape measurement to 3D inspection.
- Visual Inspection Equipment
- Image Processing Equipment
- 3D measuring device
Equipped with a high-performance image processing inspection device. This is a monochrome plain surface defect inspection system that achieves a compact design.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
This is a portable surface defect inspection system that can be used both inline and offline.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
It is a monochrome plain surface defect inspection system that combines PC-based machine vision with a high-performance image processing unit.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
It is an appearance inspection system for electrode sheets of secondary batteries.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
It is a surface defect inspection system equipped with a high-functionality, high-performance image processing device.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
It is a PC-based color inspection system with excellent scalability.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
It is an AI visual inspection system equipped with AI software that is expected to achieve learning effects through deep learning.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
It is an AI visual inspection system equipped with AI software that is expected to achieve learning effects through deep learning.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
By adopting a high-speed line sensor camera, we achieve high-speed and high-precision inspection of defect-free surfaces.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
By adopting a high-speed line sensor camera, we achieve high-speed and high-precision inspection of defects on plain surfaces.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
We propose total solutions in a one-stop manner.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
It is an AI visual inspection system equipped with AI software that is expected to achieve learning effects through deep learning.
- Defect Inspection Equipment
- Visual Inspection Equipment
- Image Processing Equipment
A new standard for water quality management at water treatment plants.
- Water quality testing
A super durable counting scale that can be used in factories. It features high-speed stability within one second and can notify you of over or under counts with a buzzer, making pass/fail judgment pos...
- Scale
New EXPLORER Launch Campaign
This is an announcement regarding a campaign to celebrate the release of the new EXPLORER balance. The Ohaus balance, EXPLORER, has been renewed, significantly improving its accuracy, functionality, and operability. When you place an order for the new EXPLORER, we will issue a "coupon." This coupon can be used for special pricing on your next order of Ohaus laboratory equipment (such as shakers, vortex mixers, etc.), pH meters, and portable turbidity meters. The campaign period is from orders placed on October 1, 2025, to orders placed on December 26, 2025.
120GBd compatible clock extraction - An essential partner for next-generation PAM4/NRZ measurement.
- Time-frequency measurements
Semight officially releases an integrated testing solution for next-generation computing interfaces compatible with 1.6T, scheduled for its first domestic exhibition at COMNEXT 2025.
Semight has officially released a 1.6T high-speed interface evaluation solution that supports AI accelerated computing and CPO. This solution consists of three main measurement instruments: ▶ DCA1065 Sampling Oscilloscope ▶ CR3302 Clock Recovery Unit ▶ PBT3058 Bit Error Rate Tester It provides high-precision and end-to-end measurement support for the development of next-generation AI optical interconnects, contributing to overcoming industry bottlenecks in high-speed data communication. As a world-leading provider of 1.6T high-speed interface test solutions, Semight is already collaborating with major optical communication manufacturers and advanced chip vendors for joint verification. We have also begun active expansion in the Japanese market, intensifying our product offerings and technical support. This product is scheduled to be showcased for the first time in Japan at COMNEXT (Tokyo Big Sight) from July 30 to August 1, 2025. We invite everyone interested in AI, CPO, and 1.6T evaluation to experience it at the venue. For product materials and demo inquiries, please contact sai@semi-next.co.jp.
Semight DCA1065 Sampling Oscilloscope — Fully meets the testing needs of the 1.6T optical module!
- oscilloscope
Semight officially releases an integrated testing solution for next-generation computing interfaces compatible with 1.6T, scheduled for its first domestic exhibition at COMNEXT 2025.
Semight has officially released a 1.6T high-speed interface evaluation solution that supports AI accelerated computing and CPO. This solution consists of three main measurement instruments: ▶ DCA1065 Sampling Oscilloscope ▶ CR3302 Clock Recovery Unit ▶ PBT3058 Bit Error Rate Tester It provides high-precision and end-to-end measurement support for the development of next-generation AI optical interconnects, contributing to overcoming industry bottlenecks in high-speed data communication. As a world-leading provider of 1.6T high-speed interface test solutions, Semight is already collaborating with major optical communication manufacturers and advanced chip vendors for joint verification. We have also begun active expansion in the Japanese market, intensifying our product offerings and technical support. This product is scheduled to be showcased for the first time in Japan at COMNEXT (Tokyo Big Sight) from July 30 to August 1, 2025. We invite everyone interested in AI, CPO, and 1.6T evaluation to experience it at the venue. For product materials and demo inquiries, please contact sai@semi-next.co.jp.
±3500V, 10fA resolution - Stable measurement even at ultra-high voltage, ideal for evaluating power devices and SiC/GaN composite materials.
- Power Supplies
From 1.6T optical modules to CPO and SiPh, everything for BERT evaluation in one device.
- Signal Generator
Semight officially releases an integrated testing solution for next-generation computing interfaces compatible with 1.6T, scheduled for its first domestic exhibition at COMNEXT 2025.
Semight has officially released a 1.6T high-speed interface evaluation solution that supports AI accelerated computing and CPO. This solution consists of three main measurement instruments: ▶ DCA1065 Sampling Oscilloscope ▶ CR3302 Clock Recovery Unit ▶ PBT3058 Bit Error Rate Tester It provides high-precision and end-to-end measurement support for the development of next-generation AI optical interconnects, contributing to overcoming industry bottlenecks in high-speed data communication. As a world-leading provider of 1.6T high-speed interface test solutions, Semight is already collaborating with major optical communication manufacturers and advanced chip vendors for joint verification. We have also begun active expansion in the Japanese market, intensifying our product offerings and technical support. This product is scheduled to be showcased for the first time in Japan at COMNEXT (Tokyo Big Sight) from July 30 to August 1, 2025. We invite everyone interested in AI, CPO, and 1.6T evaluation to experience it at the venue. For product materials and demo inquiries, please contact sai@semi-next.co.jp.
[Web Demo in Progress] Achieve highly sensitive visualization of particles and airflow with our unique visualization system!
- Other environmental analysis equipment
- Analytical Equipment and Devices
- air conditioning
We will exhibit a particle visualization system at "SEMICON Japan 2025" (December 17-19, 2025 / Tokyo Big Sight, East Exhibition Hall, East Hall 6, E6729).
We will solve the issues related to the deterioration of defect rates due to fine particles and the cleaning of manufacturing sites. The fine particle visualization system developed by Shin Nippon Air Technologies, under the ViEST brand, combines a uniquely developed ultra-sensitive camera and light source to visualize fine particles in clean rooms and equipment. It can capture their behavior in real-time while also quantifying particle information, making it a world-class visualization system. Currently, we are expanding the sale of systems and tools, as well as contract technical services utilizing them, both domestically and internationally. We have particularly rich experience in the semiconductor industry and clean rooms. The following are some examples of applications, but by using our technology, we can strongly promote solutions to various issues such as the deterioration of defect rates caused by fine foreign substances, visualization of clean airflow, and concerns regarding site cleanliness. - Visualization surveys of fine particles and airflow in manufacturing lines and environmental improvements - Promotion of cleanliness in manufacturing equipment and environments - Cleanliness evaluation of various equipment performance - Improvement of yield and quality degradation caused by contamination issues - Support for research and development requiring visualization of fine particles and airflow - Evaluation of particle generation from products.
Continuous automatic TOC measurement for water quality management at water purification plants! Compliance with the Ministry of the Environment notification [Appendix Table 30-2].
- Water quality testing
4-channel, high resolution, high-speed sampling — PXIe SMU supporting a variety of devices and applications.
- Power Supplies
[New Product Information] Semight announces the new 4-channel PXIe SMU "S2019C" - Achieving high precision, high speed, and versatility, balancing measurement automation and cost efficiency.
We are pleased to announce the official release of Semight Instruments' latest PXIe Source Measure Unit (SMU), the "S2019C." The S2019C is a high-performance model with four channels, supporting a wide output range of ±40V/±500mA (DC) and ±1A (pulse), and achieving high-resolution measurements of 1pA/1μV. This product is compatible with a variety of devices, including optical communication devices, power semiconductors, silicon photonics, MEMS, and sensors, making it suitable for a wide range of applications from research and development to mass production lines. Compliant with the PXIe standard, it allows for flexible expansion into existing chassis. With a maximum sampling rate of 1MS/s and our proprietary APFC technology, it enables fast and stable measurements. Additionally, it supports standard SCPI commands, making system control easy with Python, C#, LabVIEW, and more. It excels in multi-card synchronization and automation, making it an ideal solution for building future smart testing environments. For product materials and demo inquiries, please contact sai@semi-next.co.jp.
±200V × 1fA × 1Msps. Everything for development and evaluation measured with a single unit.
- Power Supplies
Simultaneous measurement of 48 pins with an accuracy of 1 pA. Maximizing throughput with parallel measurements.
- Other electronic measuring instruments
1kHz ultra-fast, real-time wavelength monitoring
- Optical Measuring Instruments
Using the IR series high-temperature observation furnace for demonstrations: <<Heating/Atmosphere Control/Oxidation Experiments>> Metals/Solders/Ceramics/Solder/Glass, etc.
- Testing Equipment and Devices
- Other inspection equipment and devices
- Heating device
Experience high-temperature measurements up to 1700℃ and experiments under controlled atmospheric conditions! We invite you to try high-temperature observations using the demo unit of the IR series, which represents Yonezawa Manufacturing, including heating, atmospheric control, and oxidation experiments.
- Metals / Filler materials / Ceramics / Solder / Glass, etc. - This measurement allows you to experience high-temperature observation using a demonstration unit of the "IR Series" concentrated heating furnace, which represents the test equipment manufacturer, Yokokura Seisakusho. Due to its sealed structure, the IR Series furnace can achieve a maximum temperature of 1700°C under controlled atmospheric conditions, as in the case of the IR-18SP. You can capture real-time changes in the test subject by checking videos of actual experiments and the test program. *Please note that the equipment used is a demonstration unit, and we may not be able to accommodate requests depending on the circumstances, so please contact us for details. *There may be variations depending on the thermal capacity of the test specimen. ▼Features of the IR Series▼ The rapid heating performance and superiority in temperature control, along with information from the observation port, significantly shorten heating experiment times and facilitate the screening of optimal heating conditions, contributing to improved efficiency in material development tasks.
Gas analyzer with ultra-high-speed analysis performance and excellent detection limits.
- Other environmental analysis equipment
Achieving reduced cycle time in chip manufacturing and high quality! Sensors for blade monitoring during wafer cutting.
- Other measurement, recording and measuring instruments
- Sensors
- Wafer
Notice of Participation in SEMICON JAPAN 2025
Our company will exhibit at "SEMICON JAPAN 2025," which will be held at Tokyo Big Sight starting from December 17, 2025 (Booth Number: E4727). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of semiconductor manufacturing processes and the improvement of semiconductor performance, which are continuously evolving. We warmly invite you to visit our booth and see our offerings. <Main Exhibited Products> - Visual blade inspection system for dicing processes - Non-contact high-precision thin film measurement device (interferometry technology) - Non-contact high-precision surface shape measurement device (chromatic confocal technology) - Contact/non-contact thickness measurement gauge for controlling wafer thickness during processing (interferometry technology)
The main body is a compact metal housing, making it convenient to carry! Verification Mania Series.
- Power Supplies
Data communication is possible at bandwidths of up to 40Gbps, supporting USB4 and 8K/60Hz!
- Power Supplies
■ Cloud service for automating water-related operations ■
- Data Logger
■ Cloud service for automating water-related operations ■
- Data Logger
You can remotely monitor environmental data from multiple sites, including noise levels, all at once! We visualize noise from factories and construction sites and send alert notifications!
- Data Logger
[Sample loan available!] Standard set of absolute type with a compact head of 65mm width, resolution 0.01mm.
- Sensors
- Distance measuring device