List of Microscopes products
- classification：Microscopes
256～270 item / All 1893 items
For those who have isolators. Achieving high chemical resistance and workability. Low cost and short delivery times are also possible for glove box and isolator gloves.
- Work gloves
Notice of participation in 'INTERPHEX Week Tokyo' from May 20 (Wednesday) to May 22 (Friday), 2026.
Ito Corporation will be exhibiting at "INTERPHEX Week Tokyo" held at Makuhari Messe. This exhibition is the largest in Japan, showcasing a wide range of products and services related to the research and manufacturing of pharmaceuticals, cosmetics, and regenerative medicine from 25 countries and regions around the world. Pharmaceutical and cosmetic manufacturers, as well as regenerative medicine companies, will be attending from all over the globe. We will be showcasing "Gloves for Glove Boxes/Isolators" manufactured by Tron Power. We look forward to your visit.
This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.
- Other microscopes
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
It is possible to observe cross-sections while observing FIB processing in real time.
- Contract Analysis
- Other contract services
- Electron microscope
Power device failure location / Slice & View three-dimensional reconstruction
I will introduce the three-dimensional reconstruction of failure locations using the Slice & View function of FIB-SEM. Continuous SEM images of the structure are obtained, and the resulting images are corrected for positional misalignment between the SEM images and visualized in three dimensions using 3D construction software (Avizo). By combining the position identification technique for cross-sectioning the failure location with the Slice & View function, it is possible to obtain continuous SEM images that retain the defective state and include information before and after the abnormal area.
Introducing examples of measurement cases for important management items in the production of lithium-ion batteries and all-solid-state batteries!
- Laser microscope
- Other measurement, recording and measuring instruments
Composition analysis of LIB cathode active materials by ICP luminescence analysis.
This presentation introduces the composition analysis of active materials in cathode materials using ICP emission analysis. The cathode material in lithium-ion batteries (LIB) is one of the important components that influence the battery's voltage and energy density, and the composition of the cathode material significantly affects the battery's performance. ICP emission analysis allows for qualitative and quantitative analysis of approximately 70 elements, primarily metal elements. In addition to composition analysis of LIB cathode materials, it can also be applied to various analyses, including qualitative and quantitative analysis of additives and impurities contained in samples, as well as quantitative analysis of substances regulated by the RoHS directive.
Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.
- Electron microscope
Analysis of organic-inorganic composite materials using FT-IR and EDX.
We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.
Fine cracks are easy to see! No conductive treatment is required, allowing for quick and detailed observation.
- Electron microscope
- Contract Analysis
- Contract Inspection
A microscope allows you to observe tiny defects that cannot be seen with the naked eye!
- Microscope
- Other microscopes
- Contract measurement
Non-destructive observation is possible! It is effective in detecting defects in internal conditions and adhesion states!
- Other microscopes
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
- Microscope
- Image analysis software
- Defect Inspection Equipment
![[Data] Cross-sectional observation ...](https://image.mono.ipros.com/public/product/image/5fd/2000561894/IPROS71970030245724406256.png?w=280&h=280){kind=small}
We have published cross-sectional observations in clear vision mode and normal/standard mode!
- Electron microscope
- Contract Analysis
- Contract Inspection
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
- Microscope
- Image analysis software
- Defect Inspection Equipment
High-resolution imaging with a micro probe! Achieving nano-level structural analysis.
- Contract Analysis
- Contract measurement
- Other microscopes
This is the successor model of the popular gas pressure arm stand F10. It features a rotation mechanism for the optical tube, allowing for more flexible observation.
- Optical microscope
A unique microscope stand for observing samples from a horizontal direction.
- Optical microscope
Visualizing tiny, difficult-to-observe scratches on flat surfaces! Even scratches that are hard to identify in images can be distinguished by color.
- Other microscopes
It is a microscope stand that can be securely fastened to a table with screws.
- Other microscopes