List of Coating thickness gauge products
- classification：Coating thickness gauge
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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Presentation of explanatory materials on JIS and ISO standards. We propose suitable safety barriers from a rich product series! Free rental of demo kits.
- Other safety and hygiene products
【* Demo units available, sample measurements possible】 High precision ±0.1 μm, capable of measuring a wide range from 12 μm to 80 mm thickness gauge (thickness meter).
- Coating thickness gauge
12" wafer full inspection accelerated, can also be used for full inspection of wafers.
- Coating thickness gauge
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor
Capable of measuring the total thickness of 12-inch wafers. High-speed measurement without the influence of vibrations, without a scanning stage. Suitable for online, offline, and wafer inspection app...
- Coating thickness gauge
- 3D measuring device
Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor
Using interferometric (interferometer) technology, it is possible to measure the thickness of transparent and opaque films.
- Coating thickness gauge
Notice of Participation in SEMICON JAPAN 2025
Our company will exhibit at "SEMICON JAPAN 2025," which will be held at Tokyo Big Sight starting from December 17, 2025 (Booth Number: E4727). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of semiconductor manufacturing processes and the improvement of semiconductor performance, which are continuously evolving. We warmly invite you to visit our booth and see our offerings. <Main Exhibited Products> - Visual blade inspection system for dicing processes - Non-contact high-precision thin film measurement device (interferometry technology) - Non-contact high-precision surface shape measurement device (chromatic confocal technology) - Contact/non-contact thickness measurement gauge for controlling wafer thickness during processing (interferometry technology)
Thickness measurement is possible from thick wafers to ultra-thin wafers (less than 1μm).
- Coating thickness gauge
Notice of Participation in SEMICON JAPAN 2025
Our company will exhibit at "SEMICON JAPAN 2025," which will be held at Tokyo Big Sight starting from December 17, 2025 (Booth Number: E4727). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of semiconductor manufacturing processes and the improvement of semiconductor performance, which are continuously evolving. We warmly invite you to visit our booth and see our offerings. <Main Exhibited Products> - Visual blade inspection system for dicing processes - Non-contact high-precision thin film measurement device (interferometry technology) - Non-contact high-precision surface shape measurement device (chromatic confocal technology) - Contact/non-contact thickness measurement gauge for controlling wafer thickness during processing (interferometry technology)
Speedy pinpoint check of coatings. Automatic identification of ferrous and non-ferrous measurement substrates.
- Coating thickness gauge
A revolution in the measurement of coating film thickness! A film thickness measurement support tool that dramatically improves work efficiency.
- Coating thickness gauge
- Other network tools
Film thickness measurement goes from "point" to "surface." High-speed full-area film thickness measurement device.
- Coating thickness gauge
We have a non-electrolytic nickel plating bath, as well as blackening treatment baths and film thickness measuring instruments.
- Wafer processing/polishing equipment
- Coating thickness gauge
- Special Processing Machinery
For high-precision thickness measurement of opaque materials, Enovasense's laser photo-thermal sensor can measure thickness from a minimum of 10nm, regardless of the material.
- Coating thickness gauge
Nepcon Japan 2026
We will be exhibiting at Nepcon Japan 2026, which will be held at Tokyo Big Sight from January 21 (Wed) to January 23 (Fri), 2026. If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Chromatic aberration confocal optical line sensor CLS2 3. Non-contact thickness measurement sensor for opaque materials Enovasnese
The ultrasonic thickness gauge M1458FT-300 series allows anyone to easily measure thickness.
- Coating thickness gauge
With the adoption of a CCD camera, the boundaries of each layer are clear! You can change the colors and shades of the image!
- Coating thickness gauge
We will be exhibiting at SURTECH 2020 from January 29 (Wednesday) to January 31 (Friday), 2020.
DKSH Japan Co., Ltd. will be exhibiting at the Surface Technology Elements Exhibition "SURTECH2020" held at Tokyo Big Sight. Our company provides market expansion services focused on Asia. We will introduce a wide range of cutting-edge technologies from leading manufacturers in Europe, America, and Asia, while delivering high-quality after-sales service. 【Products and Services】 ■ Ultrasonic Thickness Gauge ■ Electric Paint Borer (with Data Calculation Software) ■ Spray Particle Measurement System ■ Ultra-Micro Sample Viscometer ■ Thickness Measurement Device ■ Flow Cytometry Particle Analysis Device ■ Semi-Automatic Grid Test Device We sincerely look forward to your visit.
High-precision magnetic thickness gauge
- Coating thickness gauge
Measuring the coating thickness on metal and non-metal substrates.
- Coating thickness gauge
X-ray thickness gauge (XY axis scan) SX-1100B
- Coating thickness gauge
Beta ray thickness gauge (with display certification device). No qualifications or management area settings required!
- Coating thickness gauge
Non-destructive measurement of coating thickness on the substrate! High-precision ultrasonic pulse-type thickness gauge.
- Coating thickness gauge
- Other measurement, recording and measuring instruments
Measure film thickness up to a maximum of 8 layers at once with the ultrasonic film thickness gauge QuintSonic T.
- Coating thickness gauge
- Other painting machines
A highly reliable and safe system! Measuring sheet materials such as films and foils using ultrasonic technology.
- Weighing Machine
- Coating thickness gauge
February 2025 issue of "Production Goods Marketing" - Our company's strategic model - Easy quality control of sheet materials with the adoption of ultrasonic technology. Announcement of article featuring MeSys (Mesys) UNISENSE/MULTISENSE.
Quality control in the manufacturing process of films and sheet materials is generally conducted through non-contact inspection or off-line sampling inspection, as contact measurement for thickness measurement is difficult due to the high-speed roll transport. The MeSys UNISENSE/MULTISENSE series does not require complicated management because it uses ultrasonic technology. Please check the article for more details.
Achieve further high performance and digitalization of workflows! Streamline ultrasonic thickness measurement.
- Coating thickness gauge