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Analytical Equipment Product List and Ranking from 266 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Analytical Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ライフィクスアナリティカル Osaka//Pharmaceuticals and Biotechnology
  3. null/null
  4. 4 ビーエルテック Tokyo//Testing, Analysis and Measurement
  5. 5 サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
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Analytical Equipment Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. Nanoparticle analysis device "TaylorSizer" ライフィクスアナリティカル
  2. iCAP PRO Series ICP Emission Spectrometer サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  3. Sake FT-IR component analysis device "OenoFoss2"
  4. 4 Alcohol analysis device for sake Alcolyzer3001 SAKE
  5. 5 Laser Ablation ICP-MS System サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.

Analytical Equipment Product List

196～210 item / All 1224 items

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[LC/MS] Liquid Chromatography Mass Spectrometry

[LC/MS] Liquid Chromatography Mass Spectrometry

It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.

Liquid chromatography (LC) is classified as a type of chromatographic method that separates components of a liquid sample based on chromatographic principles. The detection of the separated components using a mass spectrometer is referred to as liquid chromatography-mass spectrometry (LC/MS). LC/MS is an analytical technique for the qualitative and quantitative analysis of organic compounds. - Effective for analyzing components with relatively large molecular weights or relatively high polarity. - By selecting the ionization method, it can accommodate thermally unstable substances and others. - There are various ionization methods available, allowing detection using the most suitable ionization method for the component (Electrospray Ionization (ESI), Atmospheric Pressure Chemical Ionization (APCI), Atmospheric Pressure Photoionization (APPI)). - High mass resolution can be achieved using mass spectrometers that utilize the Time-of-Flight method.

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Differential Thermal Balance - Mass Spectrometry Method

Differential Thermal Balance - Mass Spectrometry Method

Measurement of weight change, differential thermal analysis, heat quantity, and mass of volatile components resulting from heating the sample.

TG-DTA simultaneously evaluates weight changes due to heating (TG) and thermal behavior of endothermic and exothermic reactions (DTA). Additionally, TG-DTA-MS continuously assesses volatile components (MS) along with TG and DTA evaluations. - TG allows for the detection of weight changes on the order of percentage. - DTA provides insights into reactions such as pyrolysis, melting, sublimation, oxidation, combustion, and phase transitions. - MS enables the structural estimation of volatile components and decomposition products.

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Treatment under non-atmospheric exposure

Treatment under non-atmospheric exposure

It is possible to evaluate the sample in its original state.

■Features ? By handling samples under atmospheric non-exposure, it is possible to minimize alteration and changes even for highly reactive samples. ? Cutting, peeling, and surface preparation under atmospheric non-exposure can reduce secondary contamination and oxidation from the atmosphere. ? Methods that can be evaluated under atmospheric non-exposure: SIMS, TOF-SIMS, AES, XPS, SEM, TEM, STEM, Raman, XRD, FIB, etc.

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[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.

Organic devices are devices that use materials susceptible to the effects of oxygen and water. At MST, we conduct analyses with sample transport, processing methods, and measurement environments that minimize atmospheric influences, allowing for evaluations closer to true conditions. We assessed the interface state between the organic film and the electrode using XPS analysis. We can confirm the composition and bonding state of the titania present on the surface of the organic film. Through TOF-SIMS analysis, we examined the dispersion state of P3HT (p-type organic semiconductor) and PCBM (n-type organic semiconductor) within the organic film of bulk and heterostructure organic thin-film solar cells in the depth direction.

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[Analysis Case] Evaluation of Element Distribution in Oxide ReRAM Operating Area Using SIMS

[Analysis Case] Evaluation of Element Distribution in Oxide ReRAM Operating Area Using SIMS

High-sensitivity evaluation of local elemental distribution in oxide devices using oxygen isotopes.

In oxide ReRAM, it was suggested that oxygen diffusion associated with the application of an electric field is related to memory operation (resistance change). Since SIMS analysis allows for the measurement of isotopes, utilizing the isotope 18O ion implantation technique enables the tracking of oxygen diffusion. For devices where 18O was locally implanted, a bridge structure that serves as the operating region was formed by applying an electric field, and elemental mapping revealed that the intensity of 18O in the bridge area was weak, indicating localized reduction.

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[Analysis Case] Evaluation of the Distribution of High Fatty Acids in Hair

[Analysis Case] Evaluation of the Distribution of High Fatty Acids in Hair

Visualization of the distribution of high-grade fatty acids.

Using TOF-SIMS for ion imaging analysis of hair (beard) cross-sections, we investigated the distribution of long-chain fatty acids, which are also detected as sebum. As a result, it was found that the distribution varies depending on the type of fatty acid.

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[Analysis Case] Elemental Analysis of Active Materials in Lithium-Ion Secondary Batteries

[Analysis Case] Elemental Analysis of Active Materials in Lithium-Ion Secondary Batteries

Dismantling and sampling can be performed in a non-exposed atmospheric environment, allowing for measurements that minimize degradation and alteration.

In AES (Auger Electron Spectroscopy), it is possible to perform elemental mapping (surface analysis) at sub-micron levels, allowing for clear confirmation of the elemental distribution in ternary materials (Co, Mn, Ni). Additionally, the distribution of carbon derived from binders and conductive additives can be measured with high sensitivity. In this study, a series of processes for the positive electrode active material were conducted in an atmosphere-free environment (inert gas atmosphere) until the introduction of the equipment, minimizing alterations during measurement. As a result, it was suggested that larger particles are LiCoO2, while smaller particles are LiCoxMnyNizO2 and LiMn2O4, indicating a non-uniform distribution of particles. Measurement methods: AES・SEM Product field: Secondary batteries Analysis purpose: Composition evaluation, identification, composition distribution evaluation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells

[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells

Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.

In bulk heterojunction solar cells using p-type and n-type material active layers, it is necessary to properly control the mixing state of the materials within the film. After performing annealing treatment post-deposition, we conducted TOF-SIMS depth profiling analysis on samples that showed an improvement in photoelectric conversion efficiency along with an increase in fill factor without any change in open-circuit voltage. As a result, it was found that PCBM was segregated at the interface with the PEDOT:PSS layer before annealing.

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[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS

[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS

It is possible to achieve high-precision measurements that are not affected by surface irregularities.

In solar cells, surface roughness is utilized to effectively absorb sunlight. When conducting SIMS analysis, the surface roughness leads to a decrease in depth resolution. Measurements from the surface appear to show that elements like Cd, Zn, and O are diffusing into the CIGS layer due to the effects of surface roughness and knock-on (Figure 3), but measurements taken from the substrate side (back side) reveal that there is no significant diffusion of Cd, Zn, and O into the CIGS layer (Figure 4). In addition to interdiffusion, it is also possible to evaluate changes in the composition of the main components (Cu, In, Ga, Se) and the concentration distribution of impurities (B, Na, Fe).

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[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.

We physically peeled off the buffer layer/Alq3 interface and conducted XPS analysis on the peeled surface (buffer layer side). By peeling in an inert gas atmosphere, we were able to expose the interface without destroying the chemical structure, and by transporting it to the XPS device while maintaining the inert gas atmosphere, we minimized post-peeling alterations (such as oxidation and moisture absorption). The main component of the buffer layer is LiF, and it was suggested that some of it may have oxidized. By controlling the atmosphere, it is possible to evaluate the oxidation states of metal elements such as Al and Li due to differences in film formation methods, treatment methods, and organic layers.

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[Analysis Case] Evaluation of SiON Film by SIMS

[Analysis Case] Evaluation of SiON Film by SIMS

Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.

It is possible to evaluate the distribution of nitrogen in SiON films in the depth direction, even down to low concentration areas where high-sensitivity SIMS analysis excels, and to assess the amount of nitrogen (unit: atoms/cm²) with high precision (Figure 1). Additionally, nitrogen can be converted to atomic% (Figure 2), and a fitting curve for nitrogen can be calculated, allowing for the determination of nitrogen's peak concentration, depth, and half-width through fitting (Figure 3).

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[Analysis Case] Evaluation of B Penetration Amount from SSDP-SIMS Gate to Substrate

[Analysis Case] Evaluation of B Penetration Amount from SSDP-SIMS Gate to Substrate

Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.

By conducting SIMS analysis (SSDP-SIMS) from the substrate side, it is possible to obtain measurements that are not affected by the knock-on effects from the high-concentration layer on the surface due to surface roughness and sputtering. We evaluated the amount of boron penetration from the gate electrode (B-doped Poly-Si) into the substrate. Measurements from the substrate side showed no effects from knock-on, indicating that a more accurate evaluation of the penetration amount is possible. Thus, SSDP-SIMS is effective for assessing the barrier properties of barrier metals, the incorporation of metals into Low-k films, and the evaluation just beneath the rough silicide.

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Improvement of depth resolution by vertical incidence method.

Improvement of depth resolution by vertical incidence method.

SIMS: Secondary Ion Mass Spectrometry

■Measurement Method for Depth Direction Distribution (1) Limitations of Depth Direction Resolution in Oblique Incidence Method The dependence of depth direction resolution on primary ion energy in the oblique incidence method was investigated using δ-doped samples (Figure 1). It was found that in the oblique incidence method, there is a limit to the improvement of depth direction resolution due to the roughness of the crater bottom (Figure 2). (2) Improvement of Depth Direction Resolution by Vertical Incidence Method Figure 3 shows the relationship between the half-width of the B peak (δ-doped sample) and primary ion energy in both vertical and oblique incidence methods. In the region below 1 keV of primary ion energy, where there were limitations in improving resolution with the oblique incidence method, improvements in resolution have been achieved with the vertical incidence method.

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[RBS] Rutherford Backscattering Spectrometry

[RBS] Rutherford Backscattering Spectrometry

It is a method for measuring the energy and intensity of ions scattered backward by Rutherford scattering after irradiating a solid sample with an ion beam.

RBS is a method that irradiates solid samples with ion beams (H+, He++) and measures the energy and intensity of ions scattered backward through Rutherford scattering. By measuring the kinetic energy of the scattered He ions and examining the mass number of the colliding atoms, it is possible to evaluate the components and layer structure of the analyzed sample. Additionally, by directing He ions at a solid sample and measuring the H ions scattered forward, it is also possible to assess the hydrogen concentration in the sample. This measurement technique is known as Hydrogen Forward-Scattering Spectroscopy (HFS). It is also referred to as Elastic Recoil Detection Analysis (ERDA). - Analysis of elements from B to U is possible (H is also possible through HFS) - Quantitative analysis can be performed without using standard samples - Depth profile of composition distribution can be obtained - Density can be calculated from film thickness information obtained by other methods - Sensitivity and accuracy tend to increase with heavier elements - Non-destructive analysis

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[Analysis Case] Composite Analysis of White Powder

[Analysis Case] Composite Analysis of White Powder

Identification of powders by FT-IR analysis and XRF analysis.

When analyzing and identifying unknown samples such as foreign substances, it is effective to analyze the data comprehensively from multiple measurement methods. We will introduce a case where FT-IR analysis, which is a vibrational spectroscopy method, was combined with XRF analysis, an elemental analysis method in the atmosphere, to identify two types of white powders.

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