High-performance automatic appearance (6-sided chip) inspection device
Free hardware selection! Cameras, lenses, PCs, and other equipment available on the market can be used freely.
The "High-Function Automatic Appearance (6-Surface) Inspection Device" allows for easy and highly precise appearance inspections such as dimension measurement and defect inspection of semiconductor chips. Thanks to Z-axis image synthesis processing, even when using high-magnification lenses, deep images can be obtained quickly, and planar correction can be performed on inclined workpieces. Cameras, lenses, PCs, and other market devices can be freely used, and real-time observation with line cameras is also possible. Customization according to customer specifications is available. 【Features】 ■ High-speed long depth measurement (multi-focus imaging) ■ High-precision measurement ■ Freely configurable image processing flow ■ High-speed 6-surface inspection measurement ■ Damage-free handling mechanism *For more details, please refer to the related links or feel free to contact us.
- Company:ダイトロン
- Price:Other