X-ray inspection device for through-hole inspection 'IX-GN-24M1'
For customers in the Hyogo and China areas: Responding to various packaging defects! The highly versatile IX-GN series now features a new high-precision inspection specification for misalignment.
The "IX-GN-24M1" is an X-ray inspection device that simultaneously achieves high-precision inspection for foreign objects and overlapping materials. With the adoption of a new sensor, even thin packaging materials that were previously difficult to capture can now be detected clearly. The contrast of the target objects is distinctly visible, enabling more precise overlapping inspections. Additionally, the use of a segmented conveyor allows for inspections that are unaffected by the conveyor itself. 【Features】 - Improved sensitivity for detecting overlapping defects in thin sheets and films - Contributes to the safety and security of production lines - Allows anyone to easily perform high-precision overlapping inspections - Accommodates various types of packaging defects - Clearly captures not only the outer packaging but also the individual wrapped films inside *For more details, please refer to the PDF document or feel free to contact us.
- Company:山陽イシダ
- Price:Other