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Measuring Instrument(gas) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
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Measuring Instrument Product List

16～30 item / All 31 items

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Non-contact resistance tester "NC-80MAP"

Non-contact resistance tester "NC-80MAP"

Wide-range non-contact (eddy current method) sheet resistance/resistivity multi-point measuring instrument

The "NC-80MAP" is a resistance measuring device that supports a wide range of measurements using multiple types of non-contact probes. The number and type of probes can be changed according to your requirements. It is also capable of multi-point measurements from an edge of 8mm. Additionally, due to its non-contact eddy current method, measurements can be taken without causing any damage. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Semi-auto type ■ Multi-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Non-contact resistance tester "EC-80"

Non-contact resistance tester "EC-80"

Compact and easy-to-use manual non-contact (eddy current method) resistance meter.

The EC-80 is a simple measuring device that allows for measurements by simply placing a sample between the probes. You can easily switch between resistivity and sheet resistance measurement modes. Additionally, measurement conditions can be easily set using the JOG dial. Since it has fixed probes, you will need to choose one type from several probe types before purchase. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Manual type ■ Single-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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Transporter activity measurement device SURFE²R 96SE

Transporter activity measurement device SURFE²R 96SE

Direct measurement of transporter currents in a label-free and real-time manner without using fluorescent probes or radiolabeled ligands.

Currently, the mainstream method for evaluating transporter activity is the uptake assay using RI-labeled substrates. However, there are several issues, such as the need for specialized experimental facilities, complicated waste disposal processes, the fact that the desired substrates are not always commercially available as RI-labeled, and that the endpoint is measured after uptake. The SURFE²R (Surface Electrogenic Event Reader) technology does not require RI labeling, does not need specialized experimental facilities or waste disposal, and allows for real-time evaluation of the activity of transporters (symporters, exchangers, unipoters) and pumps. ■ Direct measurement of transporter currents using Solid Supported Membrane (SSM) ■ Experiments can be conducted using membrane fragments prepared from biological membranes or proteoliposomes reconstituted with the target membrane proteins ■ Simultaneous measurement in 96 wells ■ 10,000 data points per day

  • Other physicochemical equipment
  • Other Analysis
  • Analytical Equipment

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Transporter activity measurement device SURFE²R N1

Transporter activity measurement device SURFE²R N1

Direct measurement of transporter currents in a label-free and real-time manner without using fluorescent probes or radiolabeled ligands.

Currently, the mainstream method for evaluating transporter activity is the uptake assay using RI-labeled substrates. However, there are several issues, such as the need for specialized experimental facilities, the complexity of waste liquid treatment, the fact that the desired substrates are not always commercially available as RI-labeled, and the measurement of endpoints after uptake. SURFE²R (Surface Electrogenic Event Reader) technology does not require RI labeling, specialized experimental facilities, or waste liquid treatment, and it allows for real-time evaluation of the activity of transporters (symporters, exchangers, unipoters) and pumps. ■ Direct measurement of transporter currents using Solid Supported Membrane (SSM) ■ Experiments can be conducted using membrane fragments prepared from biological membranes or proteoliposomes reconstituted with the target membrane proteins ■ Light stimulation is possible (optional) ■ An all-in-one device that integrates a dispensing machine, measurement section, and computer ■ 150 data points per day

  • Other physicochemical equipment
  • Other Analysis
  • Analytical Equipment

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X-ray Residual Stress Analyzer

X-ray Residual Stress Analyzer

”NEW μ-X360s” The world's lightest and smallest

Portable X-ray Residual Stress Analyzer NEW μ-X360s 【Operability】 ・Easy sample setting,measurement time:Approx.60secs(Ferritic samples) 【Portability】 ・Sensor unit:Approx.2.4kg,Power supply unit:Approx.6.2kg. ・Ideally suited for field measurements. 【Applications】 ・Thermal treatment industrial of products,welding,plastic forming,surface reformation,monitoring and maintenance of plant and infrastructure.

  • X-ray inspection equipment

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Portable Gap and Step Measuring Device 'GAPGUN PRO2'

Portable Gap and Step Measuring Device 'GAPGUN PRO2'

An alternative to calipers, step gauges, and radius gauges! This system eliminates variability caused by individuals and enables quality control.

Wouldn't you like to improve dimension measurements for assembly inspections and more, making them easier and faster? "Inspection labor inevitably takes time." "Variability in inspection results occurs depending on the person." "Input errors happen when creating reports." "There are times when there are too many inspection items, making it unclear whether the work was done." The 'GAPGUN' is a portable gap and step measurement tool that uses lasers to measure the 2D cross-section of inspection points non-contact. It combines measurement speed, ease of use, portability, and robustness, allowing for high-precision measurements of steps, gaps, arcs, edge chipping, burrs, seals, angles, and more. Additionally, it navigates the user according to a pre-set inspection plan for the measurement points, and the measurement results are transferred to a PC to generate inspection result reports. 【Features】 ■ Non-contact gap, step, and R measurement tool ■ Fast non-contact measurement ■ A wide range of measurement functions accommodating various shapes ■ Consistent measurement accuracy ■ User-friendly navigation system ☆ Click the link below if you would like to see the list of functions!

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  • Other inspection equipment and devices

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High-precision non-contact thickness measurement device [for semiconductor wafers]

High-precision non-contact thickness measurement device [for semiconductor wafers]

Achieves high-resolution shape measurement. A wide variety of sensor probes are available. Inline measurement of flatness and thickness is also possible. Suitable for wafer inspection applications.

Our company handles non-contact type measuring instruments based on the principles of chromatic aberration confocal and interference. These instruments can be applied to film thickness measurement, shape measurement, roughness measurement, displacement measurement, and appearance inspection, allowing for in-process measurement during manufacturing, high-speed inline inspection, and offline measurement. We offer various interfaces to accommodate embedded applications. Measurements can be performed with high resolution (minimum XY resolution of 1μm and minimum Z resolution of 0.02μm), contributing to improved product quality and reductions in manufacturing process time and costs. 【Features】 ■ Wide range of sensor lineup Sensors can be selected according to inspection requirements and materials from various sensor probes. ■ Sensors according to measurement range Available in single-point sensors, line sensor types, and area scan types. ■ Applications Can be utilized for inspection of PCB flex, wire loop inspection, wafer bump inspection, and more. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

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  • Other measurement, recording and measuring instruments

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Near-infrared reflectance meter

Near-infrared reflectance meter

Continuous measurement possible in just 3 seconds with high precision! - We will develop an original near-infrared reflectance measuring device.

We will develop and design a reflectance measurement device tailored to the specific near-infrared range according to customer needs. ◆ Wavelengths of selectable LED light sources: 750nm to 1650nm (as of July 2023) ◆ Optical system light transmission and reception method: Unidirectional illumination - integrating sphere reception method or unidirectional transmission and reception method ◆ Measurable reflectance: Total reflectance, specular reflectance, diffuse reflectance, and retroreflectance using beam splitters (half mirrors) ◆ Designable irradiation angle and reception angle: 0° to 80° MAX relative to the normal direction Furthermore, if you wish to measure the reflectance at a specific wavelength not limited to the near-infrared range, we can also manufacture reflectance measurement devices according to your requirements. ● Our self-developed measurement device features a lightweight, compact body with rechargeable capabilities ● Achieves low cost through measurements specifically focused on near-infrared wavelengths ● Capable of measuring the performance of thermal insulation products in just 3 seconds As a product version, we sell the thermal insulation property measurement device [TP-01] with 4 wavelengths.

  • Other inspection equipment and devices
  • Other electronic measuring instruments

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Contracted measurement services, high-frequency viscoelasticity, ultrasonic propagation, sound speed, attenuation rate.

Contracted measurement services, high-frequency viscoelasticity, ultrasonic propagation, sound speed, attenuation rate.

You can easily examine viscoelasticity at unprecedented megahertz (MHz) high frequencies.

If you could send a sample, there would be no need for proficiency in measurement or to maintain expensive equipment. Recently, measurement accuracy has improved, allowing for more precise measurements of inkjet inks and similar materials than before. The measurement of megahertz hysteresis loss in liquids such as inks can also be performed similarly to solids. In the high deformation properties of inks for inkjet printers (IJ), which involve high-speed droplet ejection, the Cox-Merz rule, which treats strain rate (1/s) and deformation frequency (rad/s) as equivalent, (https://www.cerij.or.jp/service/05_polymer/rheology_freq-dependence.html) may allow for evaluation. (No freezing occurs even at megahertz) ☆ This was published in the Journal of Applied Physics. "Characterization of Inkjet Ink and Skin Layer Properties by Ultrasonic Viscoelastic Measurement" https://iopscience.iop.org/article/10.35848/1347-4065/adc609/pdf

  • Other contract services
  • Viscometer

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FastGate Inline CV/IV Measurement Device ECV-2500

FastGate Inline CV/IV Measurement Device ECV-2500

FastGate Inline CV/IV Measurement Device

It is a device that can be used inline because it does not require electrode formation, does not damage the wafer, and leaves no contamination.

  • Other inspection equipment and devices

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